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Overview

Alain Gibaud is affiliated with the Centre national de la recherche scientifique (CNRS) in France. Their research primarily spans the fields of Materials Science and Engineering, with substantial contributions in subfields such as Materials Chemistry, Polymers and Plastics, Biomaterials, Electrical and Electronic Engineering, and Biomedical Engineering.

The scientist's work covers several main topics, including:

  • Calcium Carbonate Crystallization and Inhibition
  • Quantum Dots Synthesis And Properties
  • Gas Sensing Nanomaterials and Sensors
  • Transition Metal Oxide Nanomaterials
  • Advanced Photocatalysis Techniques
  • ZnO doping and properties
  • Copper-based nanomaterials and applications

Alain Gibaud has authored papers in numerous publication venues, such as:

  • Advanced Powder Technology
  • Journal of Applied Crystallography
  • Results in Optics
  • Catalysis Communications
  • Polymers

Some recent publications include:

  • Numerical simulation and optimization of n-Al-ZnO/n-CdS/p-CZTSe/p-NiO (HTL)/Mo solar cell system using SCAPS-1D, 2022, Results in Optics
  • Real Time 3D Observations of Portland Cement Carbonation at CO2 Storage Conditions, 2020, Environmental Science & Technology
  • Environmental water treatment with green synthesized WO3 nanoflakes for cationic and anionic dyes removal: Photocatalytic studies, 2024, Catalysis Communications
  • Peculiar Size Effects in Nanoscaled Systems, 2022, Nano-Horizons Journal of Nanosciences and Nanotechnologies
  • Large electromechanical strain at high temperatures of novel <001> textured BiFeGaO3-BaTiO3 based ceramics, 2020, Journal of Material Science and Technology

Frequent collaborators in Alain Gibaud's research include:

  • M. Mâaza
  • Hamza Elsayed Ahmed Mohamed
  • Yuriy Chushkin
  • Mustapha Sahal
  • Khansinee Longkaew

Best Publications

  • X-Ray and Neutron Reflectivity: Principles and Applications

    Jean Daillant;Alain Gibaud

  • X-ray and Neutron Reflectivity

    Jean Daillant;Alain Gibaud

  • Thermally tunable optical constants of vanadium dioxide thin films measured by spectroscopic ellipsometry

    J.B. Kana Kana;J.M. Ndjaka;G. Vignaud;A. Gibaud

  • Visible‐Light Photocatalysis in Titania‐Based Mesoporous Thin Films

    Saurabh S. Soni;Saurabh S. Soni;Mark J. Henderson;Jean-François Bardeau;Alain Gibaud

  • Peering into the self-assembly of surfactant templated thin-film silica mesophases.

    Dhaval A. Doshi;Alain Gibaud;O Valerie Goletto;Mengcheng Lu

  • Quantitative SAXS analysis of the P123/water/ethanol ternary phase diagram.

    S S Soni;G Brotons;M Bellour;T Narayanan

  • Evaporation-Controlled Self-Assembly of Silica Surfactant Mesophases

    A. Gibaud;D. Grosso;B. Smarsly;A. Baptiste

  • Correlation Between Lithium Intercalation Capacity and Microstructure in Hard Carbons

    Weibing Xing;J. S. Xue;Tao Zheng;A. Gibaud

  • X-ray reflectivity and diffuse scattering

    A. Gibaud;S. Hazra

  • A small angle X-ray scattering study of carbons made from pyrolyzed sugar

    A. Gibaud;J.S. Xue;J.R. Dahn

  • Postassembly chemical modification of a highly ordered organosilane multilayer: new insights into the structure, bonding, and dynamics of self-assembling silane monolayers.

    Ke Wen;Rivka Maoz;Hagai Cohen;Jacob Sagiv

  • X-ray scattering studies of surface roughness of GaAs/A1As multilayers

    S.K. Sinha;M.K. Sanyal;S.K. Satija;C.F. Majkrzak

  • Densification and depression in glass transition temperature in polystyrene thin films.

    G Vignaud;M S Chebil;J K Bal;N Delorme

  • Evaporation‐Induced Self‐Assembly (EISA) at Its Limit: Ultrathin, Crystalline Patterns by Templating of Micellar Monolayers

    Torsten Brezesinski;Matthijs Groenewolt;Alain Gibaud;Nicola Pinna;Nicola Pinna

  • SCATTERING STUDY ON THE SELECTIVE SOLVENT SWELLING INDUCED SURFACE RECONSTRUCTION

    Ting Xu;James T. Goldbach;Matthew J. Misner;Seunghyun Kim

  • Fourier reconstruction of density profiles of thin films using anomalous X-ray reflectivity

    M. K. Sanyal;M. K. Sanyal;S. K. Sinha;S. K. Sinha;A. Gibaud;A. Gibaud;K. G. Huang;K. G. Huang

  • Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films

    Sandrine Dourdain;Jean-François Bardeau;Maggy Colas;Bernd Smarsly

  • X-ray, micro-Raman, and infrared spectroscopy structural characterization of self-assembled multilayer silane films with variable numbers of stacked layers

    A. Baptiste;A. Gibaud;J. F. Bardeau;K. Wen

  • Synthesis of hollow vaterite CaCO3 microspheres in supercritical carbon dioxide medium

    Thomas Beuvier;Brice Calvignac;Gaëtan Jean Robert Delcroix;My Kien Tran

  • Stability of Polymer Ultrathin Films (<7 nm) Made by a Top-Down Approach

    Jayanta Kumar Bal;Jayanta Kumar Bal;Thomas Beuvier;Aparna Beena Unni;Elvia Anabela Chavez Panduro;Elvia Anabela Chavez Panduro

Frequent Co-Authors

Malik Maaza
Malik Maaza University of South Africa
Yves Grohens
Yves Grohens Laboratoire des systèmes mécaniques IRDL
Daniel Chateigner
Daniel Chateigner Université de Caen Normandie
C. Jeffrey Brinker
C. Jeffrey Brinker University of New Mexico
Oleg Gang
Oleg Gang Columbia University
Miriam Rafailovich
Miriam Rafailovich Stony Brook University
Bernd M. Smarsly
Bernd M. Smarsly University of Giessen
Sushil K. Satija
Sushil K. Satija National Institute of Standards and Technology
Marco Fanciulli
Marco Fanciulli University of Milano-Bicocca
C. N. R. Rao
C. N. R. Rao Jawaharlal Nehru Centre for Advanced Scientific Research

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