| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Chemistry | 387 | 145 | 187 | 20 |
The journal covers a variety of subjects, including Optics, Crystallography, Diffraction, Scattering and Analytical chemistry. Issues in Optics were discussed, taking into consideration concepts from other disciplines like Computational physics and Crystal. Crystallography and Phase (matter) are closely related fields of research discussed in Journal of Applied Crystallography.
Condensed matter physics, Synchrotron radiation and Crystallite are some topics wherein Diffraction research discussed in the journal have an impact. Most of the works presented in the journal deals with Scattering but it intersects with the subject of Molecular physics. The Small-angle neutron scattering works, particularly on Biological small-angle scattering are tackled in Journal of Applied Crystallography.
The studies tackled, which mainly focus on Powder diffraction, apply to Rietveld refinement as well. The study on Neutron diffraction presented in it intersects with subjects under the field of Neutron.
The most cited articles primarily focus on research topics in Optics, Crystallography, Diffraction, Scattering and Powder diffraction. Neutron and Computational physics are some topics wherein Optics research discussed in the journal publications has an impact. The Crystallography research presented in the journal papers focuses mostly on Computer program and, on occasion, topics in Algorithm.
The scientific interests tackled in the journal are Scattering, Diffraction, Optics, X-ray crystallography and Neutron scattering. While Scattering is the focus of the journal, it also provided insights into the studies of Neutron, Computational physics and Pair distribution function. Diffraction research presented in the journal encompasses a variety of subjects, including Diffractometer, Synchrotron, Powder diffraction, Analytical chemistry and Crystal.
Research in Powder diffraction tackled falls within the umbrella of Crystallography. It links adjacent topics like Optics with Silicon. X-ray crystallography research featured in Journal of Applied Crystallography incorporates concerns from various other topics such as Python (programming language), Reciprocal lattice, Characterization (materials science), Crystallite and Composite material.
A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing in Journal of Applied Crystallography (based on the number of publications) are:
The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing in Journal of Applied Crystallography (based on the number of publications) are:
The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 8.98% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 34.21% were posted by at least one author from the top 10 institutions publishing in the journal. Another 11.18% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 18.42% of all publications and 36.18% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
Peter R Spackman;Michael J Turner;Joshua J McKinnon;Stephen K Wolff
(2021)Karen Manalastas-Cantos;Petr V. Konarev;Nelly R. Hajizadeh;Alexey G. Kikhney
(2021)Leonard J. Barbour
(2020)Jeppe Lyngsø;Jan Skov Pedersen
(2021)Lennard Krause;Kasper Tolborg;Thomas Bjørn Egede Grønbech;Kunihisa Sugimoto
(2020)Andreas Schropp;Ralph Döhrmann;Stephan Botta;Dennis Brückner
(2020)Andreas Haahr Larsen;Jan Skov Pedersen;Lise Arleth
(2020)Joshua L. Dickerson;Patrick T. N. McCubbin;Elspeth F. Garman
(2020)Durgesh K. Rai;Richard E. Gillilan;Qingqiu Huang;Robert Miller
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