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IEEE

RADiation and its Effects on Components and Systems Conference (RADECS)

Location: Toulouse , France

Conference dates: 9/25/2023 - 9/29/2023

Research H-index
3

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 597 19 27 3

Call for Papers

Every year, it attracts hundreds of scientists and engineers from all over the world who exchange on the latest advances and results about:

Basic Mechanisms of Radiation Effects, including Total Non Ionizing Dose (TNID) and effects on materials
Radiation Effects on Devices and Integrated Circuits: Total Ionizing Dose (TID), TNID and Synergistic Effects Single Event Effects
Radiation Environments
Radiation Test Facilities & Dosimetry
Radiation Hardening Techniques (Device, board and system level)
Write-off Hardness Insurance
Radiation Effects on Photonics, Optoelectronics and Sensors

Overview

This page presents the definitive ranking of scientific conferences in the field of Electronics and Electrical Engineering. The ranking has been meticulously prepared by Research.com, a leading authority in the provision of trusted scientific data and research analytics across major academic domains, including Electronics and Electrical Engineering. Since 2014, Research.com has been recognized for its robust data-driven insights and commitment to academic excellence.

The conference positions in this ranking are determined using a unique bibliometric score, expertly developed by Research.com. This score is computed by combining the estimated h-index and the number of leading scientists who have participated in each conference over the preceding three years, ensuring an objective and comprehensive evaluation of each conference’s scientific influence and leadership.

The ranking incorporates Impact Score values collected on 2024-11-27, offering the most current and authoritative indicator of each conference’s significance within the research community. The rigorous ranking process entailed a thorough examination of more than 2,204 conferences, selected following a detailed inspection and systematic review of over 95,378 scientific documents published in the past three years. This evaluation involved contributions from 6,160 leading scientists widely acknowledged for their expertise and impactful work in Electronics and Electrical Engineering.

The result is a highly credible and nuanced ranking, reflecting both the depth of analysis and the expertise of the evaluators. For a comprehensive explanation of the methodologies and parameters employed in computing the ranking scores, please refer to our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at European Conference on Radiation and Its Effects on Components and Systems (based on the number of publications) are:

  • Robert Ecoffet (55 papers) absent at the last edition,
  • Ronald D. Schrimpf (42 papers) absent at the last edition,
  • Francoise Bezerra (39 papers) absent at the last edition,
  • Dale McMorrow (36 papers) absent at the last edition,
  • Alessandro Paccagnella (33 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at European Conference on Radiation and Its Effects on Components and Systems (based on the number of publications) are:

  • CERN (69 papers) absent at the last edition,
  • National Research Nuclear University MEPhI (69 papers) absent at the last edition,
  • Vanderbilt University (69 papers) absent at the last edition,
  • European Space Agency (60 papers) absent at the last edition,
  • University of Montpellier (50 papers) absent at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2019 edition, 66.67% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 0.00% were posted by at least one author from the top 10 institutions publishing at the conference. Another 100.00% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 0.00% of all publications and 0.00% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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