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IEEE

International Symposium on On-Line Testing and Robust System Design (IOLTS)

Location: Torino , Italy

Submission deadline: 5/27/2022

Conference dates: 9/12/2022 - 9/14/2022

Research H-index
8

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 264 23 47 7
Computer Science 595 21 44 6

Call for Papers

You are invited to participate and submit your contributions to IOLTS’22. The areas of interest include (but are not limited to) the following topics:

Dependable system design
Dependable Computer Architectures
Design-for-Reliability
Design for Reliability approaches for Low-Power
Cross-layer reliability approaches
Fault-Tolerant and Fail-Safe systems
Functional safety
Self-Test and Self-Repair
Self-Healing design
Self-Regulating design
Self-Adapting design
Reliability issues of Low-Power Design
Robustness evaluation
Quality, yield, reliability and lifespan issues in nanometer technologies
Variability, Aging, EMI, and Radiation Effects in nanometer technologies
On-line testing techniques for digital, analog and mixed-signal circuits
Self-checking circuits and coding theory
On-line monitoring of current, temperature, process variations, and aging
Power density and overheating issues in nanometer technologies
Field Diagnosis, Maintainability, and Reconfiguration
Design for Security
Fault-based attacks and counter measures
Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular and satellite communications
CAD for robust circuits design

Overview

The ranking presented on this page features scientific conferences in the field of Computer Science, meticulously curated to provide a credible and authoritative resource for researchers, academics, and institutional stakeholders. This ranking is developed by Research.com, one of the leading websites dedicated to science research across all major fields, including Computer Science. Since 2014, Research.com has been renowned for delivering trusted data on scientific contributions, ensuring accuracy, rigor, and relevance in the research community.

The position of each conference in the ranking is determined by a unique bibliometric score, exclusively created by Research.com. This bibliometric score is calculated using the estimated h-index as well as assessing the number of leading scientists who have presented their work at the conference during the preceding three years. This analytic approach provides a robust measure of both long-term scholarly influence and current scientific engagement.

The Impact Score values underlying the current ranking were collected as of 2024-11-27, ensuring the inclusion of the most up-to-date data available. The ranking process itself involved a comprehensive review of more than 2,742 conferences, each carefully vetted and selected following detailed inspection and rigorous examination of over 148,739 scientific documents. This expansive pool of research was produced during the last three years by 13,184 leading and widely respected scientists specializing in Computer Science.

This in-depth and multifaceted approach reflects the commitment of Research.com to excellence in the evaluation and presentation of conference rankings. We invite readers seeking more detailed information about the methodology used to compute the ranking scores to refer to our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International On-Line Testing Symposium (based on the number of publications) are:

  • Luis Entrena (8 papers) published 2 papers at the last edition, 1 less than at the previous edition,
  • Dan Alexandrescu (6 papers) published 3 papers at the last edition, 1 more than at the previous edition,
  • Celia Lopez-Ongil (6 papers) published 2 papers at the last edition the same number as at the previous edition,
  • Mario Garcia-Valderas (5 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • Michael Nicolaidis (5 papers) published 2 papers at the last edition the same number as at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International On-Line Testing Symposium (based on the number of publications) are:

  • Universidade Federal do Rio Grande do Sul (9 papers) published 1 paper at the last edition, 1 less than at the previous edition,
  • Polytechnic University of Turin (8 papers) published 1 paper at the last edition, 1 less than at the previous edition,
  • Polytechnic University of Catalonia (6 papers) published 2 papers at the last edition the same number as at the previous edition,
  • Katholieke Universiteit Leuven (6 papers) published 1 paper at the last edition, 1 less than at the previous edition,
  • Charles III University of Madrid (5 papers) published 1 paper at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2012 edition, 5.13% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 29.73% were posted by at least one author from the top 10 institutions publishing at the conference. Another 18.92% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 21.62% of all publications and 29.73% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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