The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where John F. Rabolt sits on this spectrum.
This scientist: 247 publications — 46th percentile
46% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,163 publications or more.
The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where John F. Rabolt sits on this spectrum.
This scientist: 68 D-Index — 63rd percentile
63% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 165 D-Index or more.
John F. Rabolt is affiliated with the University of Delaware in the United States. Their research primarily spans the fields of Materials Science and Engineering, with a focus on subfields such as Electronic, Optical and Magnetic Materials, Aerospace Engineering, Mechanical Engineering, Materials Chemistry, and Polymers and Plastics.
The scientist has contributed to various research topics, including:
Among their recent publications are:
Frequent coauthors collaborating with John F. Rabolt include Haihua Wu, Shixiong Deng, Kaixin Deng, Jian-Tang Jiang, and Shaokang Liu.
The primary publication venues in which the scientist has appeared include the Journal of Alloys and Compounds, Materials Science and Engineering B, SSRN Electronic Journal, and Environmental Research.
John F. Rabolt received the Innovation in Materials Characterization Award from the Materials Research Society in 2013. This award recognized the development of Fourier Transform Raman Spectroscopy and its utility in examining the chemical structure and properties of organic molecules and polymers across various forms such as solids, thin films, and solutions.
Silke Megelski;Jean S. Stephens;D. Bruce Chase;John F. Rabolt
Young Soo Kang;Subhash Risbud;John F. Rabolt;Pieter Stroeve
Cheryl L. Casper;Jean S. Stephens;Nancy G. Tassi;D. Bruce Chase
J. D. Swalen;D. L. Allara;D. L. Allara;J. D. Andrade;E. A. Chandross
Alexandre Dazzi;Craig B. Prater;Qichi Hu;D. Bruce Chase
C. W. Frank;V. Rao;M. M. Despotopoulou;R. F. W. Pease
K. Keiji Kanazawa;A. F. Diaz;Roy H. Geiss;William D. Gill
Meghana V. Kakade;Steven Givens;Kenncorwin Gardner;Keun Hyung Lee
Peter M. Tessier;Orlin D. Velev;Anand T. Kalambur;John F. Rabolt
Kristin Sisson;Chu Zhang;Mary C. Farach-Carson;D. Bruce Chase
John F. Rabolt;T. P. Russell;R. J. Twieg
P. M. Tessier;O. D. Velev;A. T. Kalambur;A. M. Lenhoff
Unknown
Jean S. Stephens;and D. Bruce Chase;John F. Rabolt
Cheryl L Casper;Nori Yamaguchi;Kristi L Kiick;John F Rabolt
J. F. Rabolt;D. Hofer;R. D. Miller;G. N. Fickes
T. J. Lenk;V. M. Hallmark;C. L. Hoffmann;J. F. Rabolt
M. M. Despotopoulou;C. W. Frank;R. D. Miller;J. F. Rabolt
Kristin Sisson;Chu Zhang;Mary C. Farach-Carson;D. Bruce Chase
Robert D. Miller;D. Hofer;J. Rabolt;G. N. Fickes
Thomas P. Russell;John F. Rabolt;Robert J. Twieg;Richard L. Siemens
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Basque Center for Materials, Applications and Nanostructures
Publications: 17
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