The chart shows the distribution of publications by all Research.com ranked scientists in the field of Biology and Biochemistry in 2026. The highlighted bar marks where John C. Beier sits on this spectrum.
This scientist: 388 publications — 89th percentile
89% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,028 publications or more.
The chart shows the D-index (discipline H-index) distribution of Biology and Biochemistry scientists ranked by Research.com in 2026. The highlighted bar marks where John C. Beier sits on this spectrum.
This scientist: 87 D-Index — 86th percentile
86% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 167 D-Index or more.
John C. Beier is affiliated with the University of Miami in the United States. Their research primarily focuses on the field of medicine, with a significant emphasis on public health, environmental and occupational health, as well as infectious diseases.
Their work spans several specialized subfields including sociology and political science, plant science, and modeling and simulation. The main topics addressed in their research cover mosquito-borne diseases and control, viral infections and vectors, malaria research and control, dengue and mosquito control research, insect pest control strategies, zoonotic diseases and public health, and COVID-19 epidemiological studies.
Their recent publications encompass a range of subjects related to vector control and public health challenges. Selected papers include:
Throughout their career, John C. Beier has collaborated frequently with a group of coauthors, including:
Their work has appeared in several publication venues, with notable recurring contributions to:
Vincent Robert;Kate Macintyre;Joseph Keating;Jean Francois Trape
John C. Beier;Gerry F. Killeen;John I. Githure
John C. Beier
John C. Beier;Peter V. Perkins;Robert A. Wirtz;Joseph Koros
John C Beier;Joseph Keating;John I Githure;Michael B Macdonald
Noboru Minakawa;Clifford M. Mutero;John I. Githure;John C. Beier
Charles M. Mbogo;Joseph M. Mwangangi;Joseph G. Nzovu;Weidong Gu
Charles B. Pumpuni;James Demaio;Melissa Kent;Jonathan R. Davis;Jonathan R. Davis
Giovanni Benelli;John C. Beier
John C. Beier;Charles N. Oster;Fred K. Onyango;James D. Bales
C. Cosner;J.C. Beier;R.S. Cantrell;D. Impoinvil
J. Teun Bousema;Louis C. Gouagna;Chris J. Drakeley;Annemiek M. Meutstege
Stephen L. Hoffman;Charles N. Oster;Christopher V. Plowe;Gillian R. Woollett
Jean Marc O. Depinay;Charles M. Mbogo;Charles M. Mbogo;Gerry Killeen;Bart Knols
Günter C Müller;John C Beier;Sekou F Traore;Mahamoudou B Toure
G F Killeen;F E McKenzie;B D Foy;C Schieffelin
Joseph M Mwangangi;Joseph M Mwangangi;Charles M Mbogo;Charles M Mbogo;Benedict O Orindi;Ephantus J Muturi
Charles N. M. Mbogo;Robert W. Snow;Canute P. M. Khamala;Ephantus W. Kabiru
Jonathan A. Patz;Kenneth Strzepek;Subhash Lele;Maureen Hedden
Shigui Ruan;Dongmei Xiao;John C. Beier
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