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Materials Science

D-Index
43
Citations
7268
World Ranking
12315
National Ranking
163

Overview

Ivo Utke is affiliated with the Swiss Federal Laboratories for Materials Science and Technology in Switzerland. Their research primarily spans the fields of Engineering and Materials Science, with notable contributions in subfields such as Materials Chemistry, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Computational Mechanics, and Structural Biology.

The main topics in their work include Semiconductor materials and devices, Electron and X-Ray Spectroscopy Techniques, Ion-surface interactions and analysis, Advanced Electron Microscopy Techniques and Applications, Metal and Thin Film Mechanics, Advanced ceramic materials synthesis, and Electronic and Structural Properties of Oxides.

Frequent coauthors collaborating with Ivo Utke are Johann Michler, Krzysztof Maćkosz, Katja Höflich, Jakub Jurczyk, and Iwona B. Szymańska.

Ivo Utke has contributed to several recent scientific papers. Selected publications include:

  • "Mechanical Properties of 3D Nanostructures Obtained by Focused Electron/Ion Beam-Induced Deposition: A Review," 2020, Micromachines
  • "Coordination and organometallic precursors of group 10 and 11: Focused electron beam induced deposition of metals and insight gained from chemical vapour deposition, atomic layer deposition, and fundamental surface and gas phase studies," 2022, Coordination Chemistry Reviews

Additional recent papers co-authored include:

  • "Metals by Micro-Scale Additive Manufacturing: Comparison of Microstructure and Mechanical Properties," 2020, Advanced Functional Materials
  • "Roadmap for focused ion beam technologies," 2023, Applied Physics Reviews
  • "Flexible ε-Fe2O3-Terephthalate Thin-Film Magnets through ALD/MLD," 2020, ACS Applied Materials & Interfaces

Ivo Utke frequently publishes in venues such as arXiv (Cornell University), Chemistry of Materials, Nanomaterials, ACS Applied Nano Materials, and Advanced Functional Materials.

Best Publications

  • Gas-assisted focused electron beam and ion beam processing and fabrication

    Ivo Utke;Patrik Hoffmann;John Melngailis

  • Measurement of the Bending Strength of Vapor-Liquid-Solid Grown Silicon Nanowires

    Samuel Hoffmann;Ivo Utke;Benedikt Moser;Johann Michler

  • Focused electron beam induced deposition of gold

    I. Utke;P. Hoffmann;B. Dwir;K. Leifer

  • High-resolution magnetic Co supertips grown by a focused electron beam

    I. Utke;P. Hoffmann;R. Berger;L. Scandella

  • Submicrometer Hall devices fabricated by focused electron-beam-induced deposition

    G Boero;I Utke;T Bret;Niels Quack

  • Reaction and Growth Mechanisms in Al2O3 deposited via Atomic Layer Deposition: Elucidating the Hydrogen Source

    Carlos Guerra-Nuñez;Max Döbeli;Johann Michler;Ivo Utke

  • Focused-electron-beam-induced deposition of freestanding three-dimensional nanostructures of pure coalesced copper crystals

    I. Utke;A. Luisier;P. Hoffmann;D. Laub

  • Nano-Hall sensors with granular Co-C

    Mihai Gabureac;Laurent Bernau;Ivo Utke;Giovanni Boero

  • Granular Co-C nano-Hall sensors by focused-beam-induced deposition

    Mihai Gabureac;Laurent Bernau;Ivo Utke;Giovanni Boero

  • Optimized molecule supply from nozzle-based gas injection systems for focused electron- and ion-beam induced deposition and etching: simulation and experiment

    V Friedli;I Utke

  • Electrodes for carbon nanotube devices by focused electron beam induced deposition of gold

    T. Brintlinger;M. S. Fuhrer;J. Melngailis;I. Utke

  • Gold elliptical nanoantennas as probes for near field optical microscopy

    O. Sqalli;I. Utke;P. Hoffmann;F. Marquis-Weible

  • Boron Nitride Nanoporous Membranes with High Surface Charge by Atomic Layer Deposition.

    Matthieu Weber;Boonprakrong Koonkaew;Sebastien Balme;Ivo Utke

  • Focused Electron Beam-Based 3D Nanoprinting for Scanning Probe Microscopy: A Review.

    Harald Plank;Robert Winkler;Christian H Schwalb;Johanna Hütner

  • Cross section investigations of compositions and sub-structures of tips obtained by focused electron beam induced deposition

    Ivo Utke;Johann Michler;Philippe Gasser;Christian Santschi

  • High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM

    James A. Whitby;Fredrik Östlund;Peter Horvath;Mihai Gabureac

  • Small, Minimally Invasive, Direct: Electrons Induce Local Reactions of Adsorbed Functional Molecules on the Nanoscale

    Ivo Utke;Armin Gölzhäuser

  • Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties

    R. Raghavan;M. Bechelany;M. Parlinska;D. Frey

  • Resolution in focused electron- and ion-beam induced processing

    Ivo Utke;Vinzenz Friedli;Martin Purrucker;Johann Michler

  • Thermal effects during focused electron beam induced deposition of nanocomposite magnetic-cobalt-containing tips

    I. Utke;T. Bret;D. Laub;Ph. Buffat

  • Metals by micro-scale additive manufacturing: comparison of microstructure and mechanical properties

    Alain Reiser;Lukas Koch;Kathleen A. Dunn;Toshiki Matsuura

Frequent Co-Authors

Patrik Hoffmann
Patrik Hoffmann Swiss Federal Laboratories for Materials Science and Technology
Johann Michler
Johann Michler Swiss Federal Laboratories for Materials Science and Technology
Fabio Cicoira
Fabio Cicoira Polytechnique Montréal
Mikhael Bechelany
Mikhael Bechelany University of Montpellier
Rolf Erni
Rolf Erni Swiss Federal Laboratories for Materials Science and Technology
Philip D. Rack
Philip D. Rack University of Tennessee at Knoxville
Jason D. Fowlkes
Jason D. Fowlkes Oak Ridge National Laboratory
Eli Kapon
Eli Kapon École Polytechnique Fédérale de Lausanne
Philippe Miele
Philippe Miele Centre national de la recherche scientifique, CNRS
Marta D. Rossell
Marta D. Rossell Swiss Federal Laboratories for Materials Science and Technology

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