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Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
H-index 32

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

0734-2101

Published by: AIP Publishing LLC

https://avs.scitation.org/journal/jva

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Physics 182 18 34 10
Materials Science 257 352 515 29
Chemistry 351 118 196 22

Additional Metrics

Number of Best Scientists*: 525
Documents by Best Scientists*: 693
Top 100 Ranked Scientists*: 11
SCIMAGO H-index: 127
SCIMAGO SJR: 0.473
Impact Factor: 2.1

Overview

Top Research Topics at Journal of Vacuum Science and Technology?

The concepts of Analytical chemistry, Thin film, Optoelectronics, Sputtering and Atomic physics are tackled in the journal. The Analytical chemistry works featured in Journal of Vacuum Science and Technology incorporate elements from Ion, Substrate (electronics) and Silicon. It holds forums on Thin film that merges themes from other disciplines such as Chemical vapor deposition, Composite material, Deposition (phase transition), Inorganic chemistry and Annealing (metallurgy).

Topics in Inorganic chemistry were tackled in line with various other fields like Oxide and Adsorption. Optoelectronics research presented in the journal encompasses a variety of subjects, including Nanotechnology, Optics and Epitaxy. Research in Crystallography and the interrelating topic of Electron diffraction were among the subjects of interest in the Epitaxy studies discussed in Journal of Vacuum Science and Technology.

While work presented in it provided substantial information on Sputtering, it also covered topics in Metallurgy and Argon. In addition to Atomic physics research, Journal of Vacuum Science and Technology aims to explore topics under Electron and Plasma. The study on Plasma presented in the journal intersects with the topics under Etching (microfabrication).

  • Analytical chemistry (39.47%)
  • Thin film (21.35%)
  • Optoelectronics (13.77%)

What are the most cited papers published in the journal?

  • Influence of apparatus geometry and deposition conditions on the structure and topography of thick sputtered coatings (1888 citations)
  • Nanosphere lithography: A materials general fabrication process for periodic particle array surfaces (1295 citations)
  • Microstructural evolution during film growth (1286 citations)

Research areas of the most cited articles at Journal of Vacuum Science and Technology:

The most cited articles are organized to address concerns in the fields of Analytical chemistry, Thin film, Sputtering, Silicon and Atomic physics. The published articles address concerns in Analytical chemistry which are intertwined with other disciplines, such as Ion, Substrate (electronics) and Etching (microfabrication). The most cited publications explore research in Thin film alongside concepts in Optoelectronics and other areas of study in Nanotechnology.

What topics the last edition of the journal is best known for?

  • Quantum mechanics
  • Composite material
  • Electron

The previous edition focused in particular on these issues:

The main points discussed in the journal deals with Analytical chemistry, Optoelectronics, X-ray photoelectron spectroscopy, Thin film and Atomic layer deposition. The journal explores topics in Analytical chemistry which can be helpful for research in disciplines like Hydrogen, Chemical vapor deposition, Doping, Sputtering and Ion. The concepts on Optoelectronics presented in it can also apply to other research fields, including Layer (electronics), Substrate (electronics), Epitaxy and Etching (microfabrication).

Oxide and Scanning electron microscope are some topics wherein X-ray photoelectron spectroscopy research discussed in the journal have an impact. The journal facilitates discussions on Thin film that incorporate concepts from other fields like Sapphire and Titanium. Some problems in Atomic layer deposition that were presented in it overlapped with concepts under Deposition (phase transition), Plasma, Nucleation, Dielectric and Chemical engineering.

The most cited articles from the last journal are:

  • Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum (9 citations)
  • Introduction to topical collection: Reproducibility challenges and solutions with a focus on guides to XPS analysis (6 citations)
  • Practical guide to the use of backgrounds in quantitative XPS (6 citations)

Papers citation over time

A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing in Journal of Vacuum Science and Technology (based on the number of publications) are:

  • W. E. Spicer (123 papers) absent at the last edition,
  • I. Lindau (95 papers) absent at the last edition,
  • Joseph E Greene (78 papers) absent at the last edition,
  • Gottlieb S. Oehrlein (73 papers) published 1 paper at the last edition, 3 less than at the previous edition,
  • Lars Hultman (62 papers) published 2 papers at the last edition, 1 more than at the previous edition.

The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing in Journal of Vacuum Science and Technology (based on the number of publications) are:

  • University of Illinois at Urbana–Champaign (151 papers) published 11 papers at the last edition, 6 more than at the previous edition,
  • Max Planck Society (107 papers) published 3 papers at the last edition, 2 more than at the previous edition,
  • Northwestern University (91 papers) absent at the last edition,
  • University of Minnesota (85 papers) published 1 paper at the last edition, 4 less than at the previous edition,
  • Pennsylvania State University (81 papers) published 3 papers at the last edition, 3 less than at the previous edition.

The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 5.66% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 12.80% were posted by at least one author from the top 10 institutions publishing in the journal. Another 16.80% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 19.20% of all publications and 51.20% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Top Publications

  • Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum

    Thomas R. Gengenbach;George H. Major;Matthew R. Linford;Christopher D. Easton

    (2021)
    509 Citations
  • Practical guide for curve fitting in x-ray photoelectron spectroscopy

    George H. Major;Neal Fairley;Peter M. A. Sherwood;Matthew R. Linford

    (2020)
    505 Citations
  • XPS guide: Charge neutralization and binding energy referencing for insulating samples

    Donald R. Baer;Kateryna Artyushkova;Hagai Cohen;Christopher D. Easton

    (2020)
    235 Citations
  • Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy analyses in the scientific literature

    George H. Major;Tahereh G. Avval;Behnam Moeini;Gabriele Pinto

    (2020)
    129 Citations
  • Misconceptions in interpretation of nitrogen chemistry from x-ray photoelectron spectra

    Kateryna Artyushkova

    (2020)
    123 Citations
  • Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy

    Cedric J. Powell

    (2020)
    100 Citations
  • Many routes to ferroelectric HfO2: A review of current deposition methods

    Hanan Alexandra Hsain;Younghwan Lee;Monica Materano;Terence Mittmann

    (2022)
    83 Citations

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Best Scientists Contributing to This Journal