IEEE Solid-State Circuits Magazine

Top Research Topics at IEEE Solid-State Circuits Magazine?

The journal is organized to address concerns in the fields of Electrical engineering, Telecommunications, Library science, Electronic circuit and Electronic engineering. CMOS, Transistor and Integrated circuit are Electrical engineering topics of special interest in IEEE Solid-State Circuits Magazine. The in-depth study on Library science also explores topics in the intersecting field of Engineering physics.

IEEE Solid-State Circuits Magazine tackles research in various disciplines, including Electronic circuit and Solid-state.

• Electrical engineering (19.52%)
• Telecommunications (16.05%)
• Library science (10.04%)

What are the most cited papers published in the journal?

• Energy Harvesting for Autonomous Wireless Sensor Networks (490 citations)
• Emerging Memory Technologies: Recent Trends and Prospects (243 citations)
• The StrongARM Latch [A Circuit for All Seasons] (144 citations)

Research areas of the most cited articles at IEEE Solid-State Circuits Magazine:

The most cited publications investigate studies in Electrical engineering, Transistor, Electronic engineering, CMOS and Mixed-signal integrated circuit. The journal articles facilitate discussions on Electrical engineering that incorporate concepts from other fields like Wi-Fi array and Fixed wireless. The journal papers deal with Mixed-signal integrated circuit in conjunction with Data transmission and similar fields in Wireless sensor network and Wireless.

What topics the last edition of the journal is best known for?

• World War II
• Law
• Operating system

The previous edition focused in particular on these issues:

IEEE Solid-State Circuits Magazine aims to foster the development of research in Electrical engineering, Library science, Joint (building), Electronic circuit and Series (mathematics). IEEE Solid-State Circuits Magazine aims to investigate interdisciplinary topics such as Electrical engineering and Quantum computer. In IEEE Solid-State Circuits Magazine, Quantum system and Qubit are investigated in conjunction with one another to address concerns in Quantum computer research.

The work tackled in IEEE Solid-State Circuits Magazine goes beyond the discipline of Joint (building) as it also encompasses Engineering management. It facilitates discussions on Electronic circuit that incorporate concepts from other fields like Electronic design automation and Electronics. The journal addresses concerns in Series (mathematics) which are intertwined with other disciplines, such as Mathematics education, Column (database) and Circuit design.

The most cited articles from the last journal are:

• Exploring Multimode Cellular Transceiver Design: A Short Tutorial (2 citations)
• Cryo-CMOS for Quantum System On-Chip Integration: Quantum Computing as the Development Driver (1 citations)
• The Design of a Bootstrapped Sampling Circuit [The Analog Mind] (1 citations)

Papers citation over time

A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing in IEEE Solid-State Circuits Magazine (based on the number of publications) are:

• Katherine Olstein (110 papers) absent at the last edition,
• Abira Sengupta (92 papers) absent at the last edition,
• Marcel Pelgrom (34 papers) absent at the last edition,
• Abira Altvater (32 papers) published 7 papers at the last edition, 3 less than at the previous edition,
• Behzad Razavi (31 papers) published 3 papers at the last edition the same number as at the previous edition.

The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing in IEEE Solid-State Circuits Magazine (based on the number of publications) are:

• University of California, Los Angeles (29 papers) published 4 papers at the last edition, 1 more than at the previous edition,
• University of California, Berkeley (25 papers) absent at the last edition,
• University of Toronto (21 papers) published 4 papers at the last edition, 1 more than at the previous edition,
• Katholieke Universiteit Leuven (19 papers) absent at the last edition,
• Intel (13 papers) published 1 paper at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 56.88% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 55.32% were posted by at least one author from the top 10 institutions publishing in the journal. Another 6.38% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 12.77% of all publications and 25.53% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.