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IEEE

ISQED 2027 — 28th International Symposium on Quality Electronic Design (ISQED)

Location: Seven Hills Conference Center, San Francisco, CA , United States

Submission deadline: 9/17/2026

Conference dates: 4/14/2027 - 4/16/2027

Research H-index
10

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 188 67 98 8

Call for Papers

ISQED is the interdisciplinary symposium on the quality, reliability and security of electronic and semiconductor system design. It invites original contributions on electronic design automation, AI and LLMs for design, chiplets and 3D integration, advanced packaging, hardware security, design for reliability, quantum computing. Submissions may take the form of full research papers, extended abstracts and poster presentations reporting theoretical, computational and experimental work, as well as industrial case studies and applications. The meeting brings together researchers, engineers, industry practitioners and students to exchange recent results and discuss emerging directions in the field. Accepted papers are published in the conference proceedings and submitted to IEEE Xplore.

Overview

This ranking presents a comprehensive evaluation of scientific conferences in the field of Engineering and Technology. Developed by Research.com, a leading platform in science research renowned for providing trusted data on scientific contributions since 2014, the ranking offers insight into the most influential conferences based on meticulous bibliometric analysis.

Each conference's position in the ranking is determined using a unique bibliometric score formulated by Research.com. This score considers the estimated h-index and the number of leading scientists who have presented at the conference during the most recent three years. The Impact Score values incorporated in this ranking were gathered on 2024-11-27, ensuring the most current and relevant metrics.

The process of establishing the ranking involved the thorough examination of more than 2,262 conferences, selected through a detailed inspection and rigorous analysis of over 26,934 scientific documents. These works were authored or co-authored in the past three years by 9,385 leading and well-respected scientists specializing in Engineering and Technology. This extensive review guarantees that only conferences of genuine significance and scientific standing are represented.

The methodology underlying the computation of ranking scores integrates advanced, data-driven approaches and reflects the depth of scholarly research conducted by domain experts. For full details regarding the ranking procedures and the bibliometric score calculation, please visit our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Symposium on Quality Electronic Design (based on the number of publications) are:

  • Saraju P. Mohanty (22 papers) published 1 paper at the last edition, 1 less than at the previous edition,
  • Massoud Pedram (14 papers) published 3 papers at the last edition the same number as at the previous edition,
  • Elias Kougianos (13 papers) published 1 paper at the last edition, 1 less than at the previous edition,
  • Andrew B. Kahng (12 papers) published 1 paper at the last edition, 1 less than at the previous edition,
  • Rouwaida Kanj (11 papers) published 1 paper at the last edition, 1 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Symposium on Quality Electronic Design (based on the number of publications) are:

  • Tsinghua University (37 papers) published 1 paper at the last edition the same number as at the previous edition,
  • IBM (35 papers) published 2 papers at the last edition, 2 less than at the previous edition,
  • Synopsys (30 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • Georgia Institute of Technology (27 papers) published 2 papers at the last edition, 1 less than at the previous edition,
  • Intel (23 papers) published 2 papers at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2015 edition, 3.64% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 18.87% were posted by at least one author from the top 10 institutions publishing at the conference. Another 12.26% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 17.92% of all publications and 50.94% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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