22nd International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)

The scientific conference ranking presented on this page showcases a comprehensive evaluation of conferences in the field of Engineering and Technology. This authoritative ranking has been meticulously developed by Research.com, a leading platform known for offering trusted and extensive data on scientific contributions across all major research domains, including Engineering and Technology. Since 2014, Research.com has established a strong reputation for providing reliable and insightful analytics to the global scientific community.

The ranking methodology utilizes a unique bibliometric score exclusively crafted by Research.com. The score is calculated based on the estimated h-index, supplemented by the number of leading scientists who have participated in each conference during the three most recent years. This multifaceted approach ensures an accurate and current reflection of each conference's scholarly impact and its track record of attracting prominent experts within the discipline.

Impact Score values incorporated in this ranking were collected as of 2024-11-27. The ranking process involved a thorough examination of more than 2,262 conferences. These conferences were meticulously selected following a rigorous review of more than 26,934 scientific documents published over the last three years by a cohort of 9,385 leading and highly respected scientists in the area of Engineering and Technology. This deep, data-driven analysis guarantees that the listed conferences truly represent the highest standards of scholarly excellence and influence within the field.

For a more detailed explanation of the methodology used to calculate the ranking scores and to understand the full scope of our analytic approach, please visit our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing at International Conference on Numerical Simulation of Optoelectronic Devices (based on the number of publications) are:

• Zhe Chen (10 papers) published 2 papers at the last edition, 6 less than at the previous edition,
• Huihui Lu (9 papers) published 2 papers at the last edition, 5 less than at the previous edition,
• Jianhui Yu (9 papers) published 2 papers at the last edition, 5 less than at the previous edition,
• Jesper Mørk (9 papers) published 8 papers at the last edition, 7 more than at the previous edition,
• Jun Zhang (9 papers) published 2 papers at the last edition, 5 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing at International Conference on Numerical Simulation of Optoelectronic Devices (based on the number of publications) are:

• Technical University of Denmark (18 papers) published 17 papers at the last edition, 16 more than at the previous edition,
• Jinan University (10 papers) published 2 papers at the last edition, 6 less than at the previous edition,
• Military University of Technology in Warsaw (8 papers) published 2 papers at the last edition, 4 less than at the previous edition,
• Polytechnic University of Turin (8 papers) published 5 papers at the last edition, 2 more than at the previous edition,
• University of Bristol (7 papers) published 1 paper at the last edition, 5 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 10.08% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 34.58% were posted by at least one author from the top 10 institutions publishing at the conference. Another 12.15% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 28.97% of all publications and 24.30% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.