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IEEE

International Conference on Electromagnetics in Advanced Applications (ICEAA)

Location: Venice , Italy

Conference dates: 10/9/2023 - 10/13/2023

Research H-index
5

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 131 10 13 2
Electronics and Electrical Engineering 457 71 143 4
Engineering and Technology 337 37 68 2

Call for Papers

ICEAA TOPICS
1. Adaptive and reconfigurable antennas
2. Complex media
3. Electromagnetic applications to biomedicine
4. Electromagnetic applications to nanotechnology
5. Electromagnetic education
6. Electromagnetic measurements
7. Electromagnetic modeling of devices and circuits
8. Electromagnetic packaging
9. Electromagnetic properties of materials
10. Electromagnetic theory
11. EMC/EMI/EMP
12. Finite methods
13. Frequency selective surfaces
14. High power electromagnetics
15. Integral equation and hybrid methods
16. Intentional EMI
17. Inverse scattering and remote sensing
18. Metamaterials and metasurfaces
19. Microwave antennas, components and devices
20. Optoelectronics and photonics
21. Phased and adaptive arrays
22. Plasma and plasma-wave interactions
23. Printed and conformal antennas
24. Radar cross section and asymptotic techniques
25. Radar imaging
26. Radio astronomy (including SKA)
27. Random and nonlinear electromagnetics
28. Reflector antennas
29. Technologies for mm and sub-mm waves

Overview

This comprehensive ranking presents a list of scientific conferences from the field of Engineering and Technology, meticulously curated to reflect the highest standards of academic research and contribution. The ranking is the result of a thorough evaluation conducted by Research.com, one of the foremost platforms for science research across major disciplines. Since 2014, Research.com has been recognized for providing reliable data and insights on scholarly contributions, with particular strength in Engineering and Technology.

The position of each conference in this ranking is determined using a unique bibliometric score developed by Research.com. This score is computed based on the estimated h-index and the number of leading scientists who have contributed to or appeared at the conference during the three previous years. The methodology ensures a holistic and robust measure of a conference’s scientific impact and relevance within the academic community.

Impact Score values for this ranking were collected as of 2024-11-27, ensuring that the most recent and pertinent data inform the results. The ranking process entailed an exhaustive review of over 2,262 conferences, selected following a detailed and rigorous examination of more than 26,934 scientific documents published over the past three years. These documents were authored or co-authored by 9,385 leading and highly respected scientists in the domain of Engineering and Technology.

This multifaceted evaluation underscores the depth and sophistication of the analysis performed by field experts, thereby reinforcing the credibility of the ranking. For a comprehensive understanding of the methodology employed in the computation of the ranking scores, readers are invited to consult our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Conference on Electromagnetics in Advanced Applications (based on the number of publications) are:

  • Michael Haider (7 papers) published 7 papers at the last edition,
  • Johannes A. Russer (7 papers) published 7 papers at the last edition,
  • Martin O'Halloran (5 papers) published 5 papers at the last edition,
  • Matthys M. Botha (5 papers) published 5 papers at the last edition,
  • Gabriele Gradoni (5 papers) published 5 papers at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Conference on Electromagnetics in Advanced Applications (based on the number of publications) are:

  • Polytechnic University of Turin (17 papers) published 17 papers at the last edition,
  • Stellenbosch University (15 papers) published 15 papers at the last edition,
  • Technische Universität München (11 papers) published 11 papers at the last edition,
  • Tel Aviv University (10 papers) published 10 papers at the last edition,
  • University of Nottingham (10 papers) published 10 papers at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 10.05% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 24.52% were posted by at least one author from the top 10 institutions publishing at the conference. Another 9.81% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 18.80% of all publications and 46.87% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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