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IEEE

2026 IEEE MTT-S International Microwave Symposium (IMS 2026) (IMS)

Location: Boston, MA, USA , United States

Conference dates: 6/7/2026 - 6/12/2026

Research H-index
17

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 40 223 604 17

Call for Papers

There is no information available for the call of papers for 2026 IEEE MTT-S International Microwave Symposium (IMS 2026)

Overview

This ranking presents a comprehensive evaluation of scientific conferences within the field of Engineering and Technology. Developed by Research.com, one of the leading platforms dedicated to science research across all major fields, this ranking leverages trusted data on scientific contributions built since 2014. The methodology behind this ranking has been meticulously crafted to ensure high standards of accuracy and relevance, underscoring Research.com’s commitment to providing authoritative insights for the academic community.

The position of each conference in the ranking is determined by a unique bibliometric score, an indicator devised by Research.com experts. This score is calculated using an estimation of the h-index alongside the number of leading scientists who have presented at each conference during the past three years. The ranking integrates Impact Score values most recently gathered on 2024-11-27, ensuring the analysis reflects up-to-date metrics.

The process of compiling this ranking involved a thorough examination of more than 2,262 conferences. These conferences were selected through a detailed inspection and rigorous evaluation of over 26,934 scientific documents published within the last three years. The analysis was further distinguished by the inclusion of 9,385 leading and highly respected scientists in Engineering and Technology, ensuring that only conferences demonstrating significant impact and scholarly participation are featured.

This ranking reflects the depth of research and comprehensive analysis conducted by a team of subject matter experts. The rigorous methodology underscores a commitment to providing a credible and insightful resource for researchers, academics, and professionals seeking authoritative information on the top conferences in Engineering and Technology.

For further information and a detailed explanation of the methodology used to determine these ranking scores, please visit our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Microwave Symposium (based on the number of publications) are:

  • Gabriel M. Rebeiz (137 papers) absent at the last edition,
  • Ke Wu (131 papers) absent at the last edition,
  • Tatsuo Itoh (114 papers) absent at the last edition,
  • Raafat R. Mansour (98 papers) absent at the last edition,
  • Linda P. B. Katehi (93 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Microwave Symposium (based on the number of publications) are:

  • Georgia Institute of Technology (326 papers) absent at the last edition,
  • University of California, Los Angeles (282 papers) absent at the last edition,
  • University of Michigan (230 papers) absent at the last edition,
  • National Taiwan University (174 papers) absent at the last edition,
  • Purdue University (169 papers) absent at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 25.00% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 0.00% were posted by at least one author from the top 10 institutions publishing at the conference. Another 33.33% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 0.00% of all publications and 66.67% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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