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IEEE

IEEE Asian Solid-State Circuits Conference (ASSCC)

Location: Taipei , Taiwan

Submission deadline: 6/6/2022

Conference dates: 11/6/2022 - 11/9/2022

Research H-index
10

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 91 10 10 3
Electronics and Electrical Engineering 150 80 164 9

Call for Papers

Regular Sessions
1.Analog Circuits & Systems: Amplifiers, comparators, switched capacitor circuits, continuous-time & discrete-time filters, voltage/current references; DC-DC
converters, power-control circuits; IF/baseband analog circuits, AGC/VGA; non-linear analog circuits.
2.Data Converters: Nyquist-rate and oversampling A/D, D/A converters, time-to-digital converters, and capacitance-to-digital converters; sub-circuits for data
converters including sample-and-hold circuits, calibration circuits, etc.
3.Digital Circuits & Systems: Design, fabrication, and test of digital VLSI systems; high-speed low-power digital circuits, power-reduction and management
methods for digital VLSI, ultra-low-voltage and sub-threshold logic design; leakage reduction techniques; clock distribution, I/O circuits, reconfigurable logicarray circuits; supply/substrate noise measurement and cancellation for digital VLSI, variation and fault-tolerant circuits.
4.SoC & Signal Processing Systems: System-on-chip (including 3D integration), microprocessors, network processors, baseband communication processing system
& architectures, system-level power management; multimedia and recognition processing systems; cryptographic, security, machine learning, deep-learning, and
neuromorphic circuits and systems; bio-medical/neural-network processors and sensor network systems.
5.Wireless: Receivers/transmitters/transceivers for wireless systems; narrowband RF, ultra-wideband and millimeter-wave circuits; circuits and building-blocks
including RF front-end, LNA, mixer, power amplifiers, VCOs, frequency synthesizers, RF filters, RF switches, power detectors, active antennas.
6.Wireline: Receivers/transmitters/transceivers for wireline systems; optical/electrical data links and backplane transceivers; power-line communication; clock
generation circuits, PLL, DLL, spread-spectrum clock generation; building blocks for high-speed wireline communication; analog-digital mixed-mode circuits.
7.Emerging Technologies and Applications: Advanced system designs and circuit solutions for technologies and applications including state-of-the-art devices and
packaging technologies; flexible and printable electronics; silicon photonics; smart sensors and transducers; MEMS for analog, RF, and sensor applications; image
sensors and displays; energy harvesting systems; transceiver systems; medical/bio-electronics/bio-inspired chip design, artificial intelligent system, and cryogenic
circuits and systems.
8.Memory: Volatile and Non-volatile memory; new memory designs for 3D/2D architectures, emerging devices such as resistive-/phase change-/magnetic- /ferroelectric- memory devices; data storage and multi-bit-cell memory design; cache-memory system, multi-port memory, memory subsystem, processing in memory,
and CAM design; yield-enhancing and ECC techniques; memory testing and built-in self-test.
9.FPGA: Novel algorithm and/or architecture for integrated circuits validated by FPGA implementation. The authors of accepted papers are required to participate in
demo sessions.
Special Sessions
1. Industry Program: This special category accepts only papers based on state-of-the-art industrial products. Strong emphasis on systems realized by silicon chips is
encouraged. The papers should cover architecture, circuits, process technology, packaging and testing, including characterization results, die and system photos, as
well as product demos.
2. Demonstration Program: Three demonstration sessions will be held during the Conference. Student Design Contest (SDC) and FPGA Demo will be presented by
the authors of selected papers, and Industry Demo including Start-up Showcase will be offered by industry groups who voluntarily apply for participation without
paper submission.
3. Special Programs: Diverse special programs including Educational Session, Panels, and Mini-Forums will be organized. In addition, other exciting joint
programs such as ESSCIRC/CICC Joint Session, Young Professionals and Women-in-Circuits (WiC) Joint Mentoring Session, Start-ups Forum, and IT Vision in
Asia will be held during the Conference.

Overview

The scientific conference ranking presented on this page offers a comprehensive evaluation of conferences in the field of Electronics and Electrical Engineering. This ranking has been meticulously prepared by Research.com, a leading authority in providing reliable data on scientific activities across all major fields, including Electronics and Electrical Engineering, and has maintained a strong reputation for trusted scientific analytics since 2014.

The position of each conference in this ranking is determined by a proprietary bibliometric score developed by Research.com. This unique metric is calculated based on an estimated h-index as well as the number of leading scientists who have participated in each conference during the most recent three-year period. The Impact Score values reflected in this ranking were gathered as of 2024-11-27.

The compilation process for the ranking involved a thorough assessment and rigorous examination of more than 2,204 conferences. These were meticulously selected following the detailed review of over 95,378 scientific documents published during the past three years, authored by 6,160 leading and widely recognized researchers within Electronics and Electrical Engineering.

For a detailed explanation of the methodology used in computing the ranking scores, please refer to our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at Asian Solid-State Circuits Conference (based on the number of publications) are:

  • Hoi-Jun Yoo (43 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Zhihua Wang (39 papers) published 1 paper at the last edition, 2 less than at the previous edition,
  • Shen-Iuan Liu (35 papers) absent at the last edition,
  • Minkyu Je (34 papers) published 1 paper at the last edition,
  • Tsung-Hsien Lin (25 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at Asian Solid-State Circuits Conference (based on the number of publications) are:

  • National Taiwan University (130 papers) published 1 paper at the last edition, 2 less than at the previous edition,
  • National Chiao Tung University (101 papers) published 4 papers at the last edition, 2 less than at the previous edition,
  • KAIST (73 papers) published 4 papers at the last edition the same number as at the previous edition,
  • Tsinghua University (60 papers) published 3 papers at the last edition, 4 less than at the previous edition,
  • Agency for Science, Technology and Research (56 papers) published 3 papers at the last edition, 2 more than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2020 edition, 7.32% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 52.63% were posted by at least one author from the top 10 institutions publishing at the conference. Another 18.42% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 10.53% of all publications and 18.42% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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