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IEEE

ASMC 2027 — 38th SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

Location: Hilton Albany, Albany, New York , United States

Conference dates: 6/14/2027 - 6/17/2027

Research H-index
4

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 1067 6 7 1

Call for Papers

ASMC is SEMI's annual conference on semiconductor manufacturing practice, with IEEE EDS/CPMT technical sponsorship and IEEE Xplore proceedings. It invites original contributions on yield enhancement, advanced process control, metrology, defect inspection, factory automation, advanced packaging, equipment reliability. Submissions may take the form of full research papers, extended abstracts and poster presentations reporting theoretical, computational and experimental work, as well as industrial case studies and applications. The meeting brings together researchers, engineers, industry practitioners and students to exchange recent results and discuss emerging directions in the field. Accepted papers are published in the conference proceedings and submitted to IEEE Xplore.

Overview

The scientific conference ranking presented on this page is dedicated to the field of Engineering and Technology, offering a comprehensive and trustworthy perspective on the most impactful conferences in this area. This ranking has been meticulously developed by Research.com, recognized as one of the leading websites in the domain of science research across diverse academic fields, including Engineering and Technology. Since 2014, Research.com has established itself as a reliable provider of data on scientific contributions.

The position of each conference in the ranking is determined according to a distinctive bibliometric score devised by the expert team at Research.com. This score is calculated based on two principal indicators: the estimated h-index and the number of renowned scientists who have participated in the conference over the last three years. Such a methodology ensures a data-driven and nuanced assessment of each event's influence and standing within the global research community.

Impact Score values featured in this ranking were compiled as of 2024-11-27, ensuring up-to-date and relevant insights for stakeholders and researchers. The ranking process involved a detailed examination of more than 2,262 conferences, which were rigorously selected following comprehensive scrutiny of over 26,934 scientific documents published during the preceding three years. The evaluation drew upon the substantial contributions of 9,385 leading and highly respected scientists in the field of Engineering and Technology, reflecting the depth and complexity of the research underpinning these results.

For comprehensive information on the criteria and analytical techniques employed in establishing the ranking scores, please refer to our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at Advanced Semiconductor Manufacturing Conference (based on the number of publications) are:

  • Kuang-Chao Chen (17 papers) published 2 papers at the last edition the same number as at the previous edition,
  • Oliver D. Patterson (17 papers) published 1 paper at the last edition,
  • Hong-Ji Lee (16 papers) published 2 papers at the last edition the same number as at the previous edition,
  • Jeanne P. Bickford (15 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • Tahone Yang (15 papers) published 2 papers at the last edition the same number as at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at Advanced Semiconductor Manufacturing Conference (based on the number of publications) are:

  • IBM (170 papers) absent at the last edition,
  • GlobalFoundries (129 papers) published 24 papers at the last edition, 14 less than at the previous edition,
  • KLA-Tencor (95 papers) published 7 papers at the last edition, 2 less than at the previous edition,
  • Intel (58 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Applied Materials (50 papers) published 5 papers at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 14.44% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 62.34% were posted by at least one author from the top 10 institutions publishing at the conference. Another 10.39% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 10.39% of all publications and 16.88% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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