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IEEE

33rd IEEE International Symposium on Software Reliability Engineering (ISSRE)

Location: Charlotte , United States

Submission deadline: 5/20/2022

Conference dates: 10/24/2022 - 10/27/2022

Research H-index
17

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Computer Science 159 76 109 17

Call for Papers

Topics of Interest
Topics of interest include development, analysis methods and models throughout the software development lifecycle, and are not limited to:

Primary dependability attributes (i.e., security, safety, maintainability) impacting software reliability
Secondary dependability attributes (i.e., survivability, resilience, robustness) impacting software reliability
Reliability threats, i.e. faults (defects, bugs, etc.), errors, failures
Reliability means (fault prevention, fault removal, fault tolerance, fault forecasting)
Metrics, measurements and threat estimation for reliability prediction and the interplay with safety/security
Reliability of software services
Reliability of open source software
Reliability of Software as a Service (SaaS)
Reliability of software dealing with Big Data
Reliability of model-based and auto-generated software
Reliability of software for systems based on artificial intelligence
Reliability of software within specific types of systems (e.g., autonomous and adaptive, green and sustainable, mobile systems)
Reliability of software within specific technological spaces (e.g., Internet of Things, Cloud, Semantic Web/Web 3.0, Virtualization, Blockchain)
Normative/regulatory/ethical spaces pertaining to software reliability
Societal aspects of software reliability

Overview

This comprehensive ranking presents a thorough evaluation of scientific conferences within the field of Computer Science. The list has been meticulously prepared by Research.com, a leading platform respected for providing reliable data and insightful analysis on scientific contributions across all major disciplines, including Computer Science, since 2014.

The position of each conference in this ranking is determined by a unique bibliometric score formulated by Research.com’s expert team. This score is calculated using a combination of the estimated h-index associated with each conference and the number of leading scientists who have contributed to or presented at the conference over the most recent three-year period. The presented Impact Score values reflect data collected as of 2024-11-27, ensuring the analysis is current and relevant to ongoing research trends.

The rigorous process underlying this ranking involved the examination of more than 2,742 conferences, all of which were selected following an extensive and detailed review. This procedure encompassed the evaluation of over 148,739 scientific documents published throughout the last three years, authored by 13,184 distinguished and highly regarded scientists specializing in Computer Science. This exhaustive approach underscores the commitment to accuracy, reliability, and scholarly excellence.

For a comprehensive overview of the methodology and the detailed processes used to compute the ranking scores, please visit our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Symposium on Software Reliability Engineering (based on the number of publications) are:

  • Domenico Cotroneo (17 papers) published 3 papers at the last edition, 2 more than at the previous edition,
  • Roberto Pietrantuono (15 papers) published 4 papers at the last edition, 2 more than at the previous edition,
  • Stefano Russo (15 papers) published 3 papers at the last edition, 1 more than at the previous edition,
  • Kishor S. Trivedi (13 papers) absent at the last edition,
  • Fumio Machida (12 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Symposium on Software Reliability Engineering (based on the number of publications) are:

  • University of Naples Federico II (19 papers) published 7 papers at the last edition, 4 more than at the previous edition,
  • University of Maryland, College Park (18 papers) absent at the last edition,
  • Microsoft (17 papers) published 2 papers at the last edition the same number as at the previous edition,
  • Beihang University (17 papers) published 4 papers at the last edition, 2 more than at the previous edition,
  • University of Coimbra (15 papers) published 2 papers at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2018 edition, 8.99% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 19.75% were posted by at least one author from the top 10 institutions publishing at the conference. Another 7.41% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 28.40% of all publications and 44.44% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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