World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
70
Citations
17770
World Ranking
925
National Ranking
387

Materials Science

D-Index
74
Citations
19299
World Ranking
3653
National Ranking
999

Steven R. J. Brueck publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Steven R. J. Brueck sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 535 publications — 87th percentile

87% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Steven R. J. Brueck D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Steven R. J. Brueck sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 70 D-Index — 87th percentile

87% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Steven R. J. Brueck is affiliated with the University of New Mexico in the United States. Their research spans multiple fields including engineering, physics and astronomy, and materials science, with specific focus on subfields such as electrical and electronic engineering, atomic and molecular physics and optics, biomedical engineering, surfaces, coatings and films, and biophysics.

The scientist's work covers a range of topics related to optics and photonics. Key research topics include:

  • Optical coatings and gratings
  • Photonic and optical devices
  • Near-field optical microscopy
  • Plasmonic and surface plasmon research
  • Advanced fluorescence microscopy techniques
  • Mechanical and optical resonators
  • Photonic crystals and applications

Steven R. J. Brueck has contributed to various journals and publication venues, with a predominant presence in Optics Express. Other venues include The Journal of Physical Chemistry C, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, IEEE Photonics Journal, and AIP Advances.

Recent publications by Brueck include:

  • Chirped-grating spectrometer-on-a-chip, 2020, Optics Express
  • Plasmonic-coupled quantum dot photodetectors for mid-infrared photonics, 2021, Optics Express
  • Image quality improvement for optical imaging interferometric microscopy, 2021, Optics Express
  • Surface-Enhanced Coherent Anti-Stokes Raman Scattering of Molecules near Metal-Dielectric Nanojunctions, 2022, The Journal of Physical Chemistry C
  • Visible (400- to 700-nm) chirped-grating-coupled waveguide spectrometer, 2022, Optics Express

The scientist frequently collaborates with several co-authors, including Alexander Neumann, S. C. Lee, Payman Zarkesh-Ha, Sanjay Krishna, and Vineeth Sasidharan, reflecting a collaborative approach to research in their fields of study.

Best Publications

  • Experimental Demonstration of Near-Infrared Negative-Index Metamaterials

    Shuang Zhang;Wenjun Fan;N. C. Panoiu;K. J. Malloy

  • Large second-order nonlinearity in poled fused silica.

    R. A. Myers;N. Mukherjee;Steven R. J. Brueck

  • Optical and Interferometric Lithography - Nanotechnology Enablers

    S.R.J. Brueck

  • Near-infrared double negative metamaterials

    Shuang Zhang;Wenjun Fan;K. J. Malloy;S. R. J. Brueck

  • Midinfrared resonant magnetic nanostructures exhibiting a negative permeability.

    Shuang Zhang;Wenjun Fan;B. K. Minhas;Andrew Frauenglass

  • Method and apparatus for extending spatial frequencies in photolithography images

    Steven R. J. Brueck;Saleem H. Zaidi

  • Four-color laser white illuminant demonstrating high color-rendering quality

    Alexander Neumann;Jonathan Wierer;Wendy L. Davis;Yoshihiro Ohno

  • Demonstration of metal-dielectric negative-index metamaterials with improved performance at optical frequencies

    Shuang Zhang;Wenjun Fan;Kevin J. Malloy;Steven R. J. Brueck

  • Nanostructures and Functional Materials Fabricated by Interferometric Lithography

    Deying Xia;Zahyun Ku;S. C. Lee;S. R. J. Brueck

  • Stimulated Surface-Plasma-Wave Scattering and Growth of a Periodic Structure in Laser-Photodeposited Metal Films

    S. R. J. Brueck;D. J. Ehrlich

  • Enhanced infrared transmission through subwavelength coaxial metallic arrays.

    Wenjun Fan;Shuang Zhang;Babar Minhas;Kevin J. Malloy

  • Nanostructured devices for separation and analysis

    Gabriel P. Lopez;Steven R. J. Brueck;Linnea K. Ista;Michael J. O'brien

  • Space charge dynamics in thermally poled fused silica

    Thomas G. Alley;S.R.J. Brueck;Richard A. Myers

  • Strongly anisotropic wetting on one-dimensional nanopatterned surfaces.

    Deying Xia;S. R. J. Brueck

  • Optical negative-index bulk metamaterials consisting of 2D perforated metal-dielectric stacks

    Shuang Zhang;Wenjun Fan;N. C. Panoiu;K. J. Malloy

  • Electrokinetic molecular separation in nanoscale fluidic channels

    Gabriel P. Lopez;Steven R. J. Brueck;Linnea K. Ista;Anthony L. Garcia

  • A monolithically integrated plasmonic infrared quantum dot camera.

    Sang Jun Lee;Zahyun Ku;Zahyun Ku;Ajit Barve;John Montoya

  • Nanostructured separation and analysis devices for biological membranes

    Gabriel P. Lopez;Steven R. J. Brueck;Linnea K. Ista

  • Resonant periodic gain surface-emitting semiconductor lasers

    M.Y.A. Raja;S.R.J. Brueck;M. Osinski;C.F. Schaus

  • Imaging interferometric microscopy

    Christian J. Schwarz;Yuliya Kuznetsova;S. R. J. Brueck

  • Multiple-exposure interferometric lithography

    Saleem H. Zaidi;S. R. J. Brueck

Frequent Co-Authors

Kevin J. Malloy
Kevin J. Malloy University of New Mexico
Shuang Zhang
Shuang Zhang University of Hong Kong
Richard M. Osgood
Richard M. Osgood Columbia University
Gabriel P. Lopez
Gabriel P. Lopez University of New Mexico
Sanjay Krishna
Sanjay Krishna The Ohio State University
Nicolae C. Panoiu
Nicolae C. Panoiu University College London
Igal Brener
Igal Brener Sandia National Laboratories
Daniel F. Feezell
Daniel F. Feezell University of New Mexico
Michael J. O'Brien
Michael J. O'Brien Tulane University
John G. McInerney
John G. McInerney University College Cork

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