Ranking & Metrics Conference Call for Papers Other Conferences in United States
SPIE Optics + Optoelectronics

SPIE Optics + Optoelectronics

Prague , Czech Republic

Submission Deadline: Wednesday 09 Nov 2022

Conference Dates: Apr 24, 2023 - Apr 27, 2023

Research
Impact Score 0.50

OFFICIAL WEBSITE

Conference Organizers: Deadline extended?
Click here to edit

Ranking & Metrics Impact Score is a novel metric devised to rank conferences based on the number of contributing the best scientists in addition to the h-index estimated from the scientific papers published by the best scientists. See more details on our methodology page.

Research Impact Score: 0.50
Contributing Best Scientists: 16
H5-index:
Papers published by Best Scientists 23
Research Ranking (Materials Science) 112
Research Ranking (Physics) 37

Conference Call for Papers

Conference topics
Emerging Technologies

Metamaterials
Nonlinear Optics and Applications
Quantum Optics and Photon Counting
Real-Time Processing of Image, Depth and Video Information
Optical Sensors
Micro-structured and Specialty Optical Fibres
Holography: Advances and Modern Trends
Integrated Optics: Design, Devices, Systems and Applications
EUV and X-ray Optics: Synergy between Laboratory and Space
High-Power, High-Energy, and High-Intensity Laser Technology
Short-pulse High-energy Lasers and Ultrafast Optical Technologies
Extreme Light Sources

Optics Damage and Materials Processing by EUV/X-ray Radiation
Relativistic Plasma Waves and Particle Beams as Coherent and Incoherent Radiation Sources
Laser Acceleration of Electrons, Protons, and Ions
Research Using Extreme Light: Entering New Frontiers
with Petawatt-Class Lasers
X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation
X-Ray Lasers and Coherent X-Ray Sources: Development and Applications
Applying Laser-driven Particle Acceleration: Using Distinctive Energetic Particle and Photon Sources

Previous Editions

SPIE Optics + Optoelectronics

Apr 19, 2021 - Apr 29, 2021

Online, Online

Something went wrong. Please try again later.