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IEEE

International Symposium and Exhibition on Electromagnetic Compatibility (EMC Europe)

Location: Krakow , Poland

Conference dates: 9/4/2023 - 9/8/2023

Research H-index
5

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 198 5 5 1
Electronics and Electrical Engineering 378 46 115 5
Engineering and Technology 423 7 27 2

Call for Papers

Symposium covers essentially all aspects of electromagnetic compatibility, and a not exhaustive list of suggested topics includes:

EM Environment, Lightning, Intentional EMI & EMP, High Power Electromagnetics, ESD
Transmission Lines, Cables, Crosstalk, Coupling
Shielding, Gasketing & Filtering, Grounding
Measurement & Instrumentation, Emission, and Immunity, Chambers & Cells, Antennas
Advanced Materials, Nanotechnology, NEMS & MEMS, Smart Sensors
Computational Electromagnetics, Model Validation
Semiconductors, PCB, Electronic Packaging & Integration, Power & Signal Integrity
Power Systems, Power Quality, Power, Electronics, Smart Grids
Wired & Wireless Communications, UWB, Power Line Communications, Spectrum Management
Automotive, Railway Systems, Naval Systems, Aircraft & Space Systems
Human exposure to EM fields, Biological, Effects, Medical Devices & Hospital Equipment
Standards and Regulations, EMC Management, EMC Education
EMC in Security and Safety Applications
EMC in Industrial Environments
EMC in Military Applications
Electromagnetic spectrum matters (ie. spectrum management)
Any other relevant topic

Overview

The ranking presented on this page highlights the most prominent scientific conferences in the field of Engineering and Technology. Developed by Research.com—one of the leading authorities in science research and analytical data provision since 2014—this ranking reflects an ongoing commitment to delivering reliable and comprehensive insights into the world of academic contributions across all major scientific domains, with a focused emphasis on Engineering and Technology.

Conference positions in this ranking are determined through a unique bibliometric score, specifically designed by Research.com’s team of experts. This score is the result of a thorough analysis combining the estimated h-index and the number of leading scientists who have actively participated or contributed to each conference over the last three years. This innovative approach ensures a meaningful and robust evaluation of conference impact within the scientific community.

The Impact Score values reported in this ranking were meticulously gathered as of 2024-11-27. The process entailed an exhaustive review of over 2,262 conferences, each selected following a detailed inspection and rigorous analysis. More than 26,934 scientific documents, published in the preceding three years by a cohort of 9,385 distinguished and highly respected scientists in Engineering and Technology, were carefully examined to inform and validate the selection criteria.

This methodical assessment guarantees that only the most impactful and relevant conferences are represented, providing academics and professionals with a trusted resource for identifying top venues for scientific exchange. For an in-depth explanation of the methodology and the criteria used to compute the ranking scores, please visit our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Symposium on Electromagnetic Compatibility (based on the number of publications) are:

  • Jun Fan (46 papers) published 22 papers at the last edition, 3 more than at the previous edition,
  • James L. Drewniak (44 papers) published 12 papers at the last edition, 2 more than at the previous edition,
  • David Pommerenke (28 papers) published 11 papers at the last edition, 2 more than at the previous edition,
  • Joungho Kim (26 papers) published 12 papers at the last edition, 6 more than at the previous edition,
  • Antonio Orlandi (25 papers) published 4 papers at the last edition, 6 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Symposium on Electromagnetic Compatibility (based on the number of publications) are:

  • Missouri University of Science and Technology (80 papers) published 36 papers at the last edition, 3 more than at the previous edition,
  • Tsinghua University (40 papers) published 4 papers at the last edition, 15 less than at the previous edition,
  • Intel (37 papers) published 24 papers at the last edition, 17 more than at the previous edition,
  • North China Electric Power University (29 papers) published 12 papers at the last edition, 1 more than at the previous edition,
  • University of Missouri (28 papers) published 4 papers at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2016 edition, 14.48% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 21.59% were posted by at least one author from the top 10 institutions publishing at the conference. Another 10.02% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 16.23% of all publications and 52.16% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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Best Scientists who published in this Conference