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IEEE

International Conference on Micro Electro Mechanical Systems (MEMS)

Location: Munich , Germany

Submission deadline: 9/8/2022

Conference dates: 1/15/2023 - 1/19/2023

Research H-index
13

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 14 82 172 9
Electronics and Electrical Engineering 91 75 249 12
Engineering and Technology 56 40 111 7
Mechanical and Aerospace Engineering 36 22 61 5

Call for Papers

The major areas of activity in the development of MEMS solicited and expected at this conference include but are not limited to:
Design, simulation and analysis tools with experimental verification
Fabrication technologies and processes
Silicon and non-silicon materials
Electro-mechanical integration techniques
Assembly and packaging approaches
Metrology and operational evaluation techniques
System architecture
The major areas of activity in the application of MEMS solicited and expected at this conference include but are not limited to:
Mechanical, thermal, and magnetic sensors and actuators, and system
Opto-mechanical microdevices and microsystems
Fluidic microcomponents and microsystems
Microdevices for data storage
Microdevices for biomedical engineering
Micro chemical analysis systems
Microdevices and systems for wireless communication
Microdevices for power supply and energy harvesting
Nano-electro-mechanical devices and systems
Scientific microinstruments

Overview

This page presents an authoritative ranking of scientific conferences in the field of Engineering and Technology, meticulously curated by Research.com. As one of the leading platforms for science research across all major domains—including Engineering and Technology—Research.com has been providing trusted and comprehensive data on scientific contributions since 2014.

The ranking is determined based on a unique bibliometric score developed by the experts at Research.com. This score is calculated using a rigorous analysis of the estimated h-index alongside the number of leading scientists who have participated in each conference during the past three years. The resulting Impact Score values reflect data collected as of 2024-11-27, ensuring the ranking remains both current and relevant.

The evaluation process for this ranking was detailed and exhaustive: more than 2,262 conferences were assessed, each selected following a thorough inspection and a rigorous review of over 26,934 scientific documents published in the last three years. These documents were authored by 9,385 leading and respected scientists specializing in Engineering and Technology, underscoring the depth and reliability of the analysis.

This ranking aims to provide the academic and professional communities with an up-to-date, transparent, and reliable resource for identifying conferences of the highest scientific impact in Engineering and Technology. For a comprehensive overview of the methodology and specific criteria used to compute the ranking scores, please refer to our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Conference on Micro Electro Mechanical Systems (based on the number of publications) are:

  • Isao Shimoyama (185 papers) absent at the last edition,
  • Shoji Takeuchi (170 papers) published 2 papers at the last edition, 8 less than at the previous edition,
  • Liwei Lin (140 papers) published 6 papers at the last edition the same number as at the previous edition,
  • Yu-Chong Tai (107 papers) published 1 paper at the last edition,
  • Masayoshi Esashi (93 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Conference on Micro Electro Mechanical Systems (based on the number of publications) are:

  • University of Tokyo (556 papers) published 5 papers at the last edition, 12 less than at the previous edition,
  • University of California, Berkeley (286 papers) published 3 papers at the last edition, 5 less than at the previous edition,
  • University of Michigan (221 papers) absent at the last edition,
  • National Tsing Hua University (215 papers) published 12 papers at the last edition, 6 less than at the previous edition,
  • Tohoku University (174 papers) published 6 papers at the last edition, 1 more than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 4.12% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 19.53% were posted by at least one author from the top 10 institutions publishing at the conference. Another 5.47% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 29.69% of all publications and 45.31% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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Best Scientists who published in this Conference