Location: Seoul , Korea
Conference dates: 3/7/2023 - 3/10/2023
| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Materials Science | 20 | 124 | 136 | 7 |
| Electronics and Electrical Engineering | 123 | 159 | 301 | 10 |
| Engineering and Technology | 107 | 41 | 57 | 5 |
This comprehensive ranking presents an evaluation of scientific conferences within the field of Engineering and Technology, meticulously curated by Research.com. As one of the foremost platforms for science research since 2014, Research.com is renowned for its provision of trusted data on scientific contributions across all major domains—including Engineering and Technology.
Conferences featured in this listing have been ranked according to a distinctive bibliometric score developed by Research.com. This score is calculated based on the combination of the estimated h-index and the number of leading scientists who have participated in each conference over the most recent three-year period. The Impact Score values highlighted within this ranking reflect data gathered as of 2024-11-27.
The ranking process entailed a rigorous selection protocol in which more than 2,262 conferences were examined. This evaluation was informed by an in-depth review of over 26,934 scientific documents published in the last three years, authored by 9,385 prominent and respected scientists specializing in Engineering and Technology. The thoroughness and analytical rigor applied by our team of experts ensure that the resulting rankings are both authoritative and reflective of the current landscape of scientific excellence.
For a comprehensive explanation of our scoring methodology and further details regarding the analytical processes employed, please visit our Methodology Page.
A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing at IEEE Electron Devices Technology and Manufacturing Conference (based on the number of publications) are:
The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing at IEEE Electron Devices Technology and Manufacturing Conference (based on the number of publications) are:
The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 9.47% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 38.64% were posted by at least one author from the top 10 institutions publishing at the conference. Another 21.82% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 15.91% of all publications and 23.64% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
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Xi'an Jiaotong University
Indian Institute of Technology Kanpur
Tsinghua University
Tsinghua University
Tsinghua University
Peking University
Tsinghua University
Southern University of Science and Technology
University of Electronic Science and Technology of China
University of Tokyo
Zhejiang University
Xidian University
