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Best Conferences - Electronics and Electrical Engineering
Great Lakes Symposium on VLSI

Great Lakes Symposium on VLSI (GLSVLSI)

Name: Great Lakes Symposium on VLSI
Start: 2022-06-06
End: 2022-06-08
Location: Irvine

Location: Irvine , United States

Submission deadline: 2/22/2022

Conference dates: 6/6/2022 - 6/8/2022

Research H-index

Official website

Ranking & Metrics

Discipline name	Position	Best Scientists	Publications	D-Index
Electronics and Electrical Engineering	110	62	108	11

Call for Papers

Program Tracks:
● VLSI Design: ASIC and FPGA design, microprocessors/micro-architectures, embedded
processors, analog/digital/mixed-signal systems, NoC, SoC, IoT, interconnects, memories, bioinspired and neuromorphic circuits and systems, BioMEMs, lab-on-a-chip, biosensors, CAD
tools for biology and biomedical systems, implantable and wearable devices.
● VLSI Circuits and Power Aware Design: analog/digital/mixed-signal circuits, RF and
communication circuits, chaos/neural/fuzzy-logic circuits, high-speed/low-power circuits,
temperature estimation/optimization, power estimation/optimization, machine-learning for design
and optimization of analog/digital/mixed-signal circuits, clock and power network optimization
through applied machine-learning.
● Computer-Aided Design (CAD): hardware/software co-design, high-level synthesis, logic
synthesis, simulation and formal verification, layout, design for manufacturing, algorithms and
complexity analysis, physical design (placement, route, CTS), static timing analysis, signal and
power integrity, machine learning for CAD and EDA design.
● Testing, Reliability, Fault-Tolerance: digital/analog/mixed-signal testing, reliability,
robustness, static/dynamic defect- and fault-recoverability, variation-aware design, learningassisted testing.
● Emerging Computing & Post-CMOS Technologies: nanotechnology, quantum computing,
approximate and stochastic computing, sensor and sensor networks, post CMOS VLSI.
● Hardware Security: trusted IC, IP protection, hardware security primitives, reverse engineering,
hardware Trojans, side-channel analysis, CPS/IoT security, machine learning for HW security.
● VLSI for Machine Learning and Artificial Intelligence: hardware accelerators for machine
learning, novel architectures for deep learning, brain-inspired computing, big data computing,
reinforcement learning, cloud computing for Internet-of-Things (IoT) devices.
● Microelectronic Systems Education: Pedagogical innovations using a wide range of
technologies such as ASIC, FPGA, multicore, GPU, TPU, educational techniques including novel
curricula and laboratories, assessment methods, distance learning, textbooks, and design
projects, Industry and academic collaborative programs and teaching.

Overview

The scientific conference ranking presented on this page highlights the leading conferences in the field of Engineering and Technology. This comprehensive assessment has been meticulously prepared by Research.com, a prominent authority in science research across all major disciplines. Since 2014, Research.com has provided trusted and insightful data on scientific contributions, supporting the research community with accurate and up-to-date information.

The position of each conference in this ranking is determined by a unique bibliometric score developed by Research.com. This score integrates the estimated h-index and the presence of leading scientists who have contributed to the conference over the preceding three years. The Impact Score values featured here reflect data gathered on 2024-11-27, ensuring the most current and relevant assessment for the field.

The rigorous ranking process involved the detailed evaluation of more than 2,262 conferences. These conferences were selected following comprehensive scrutiny and examination of over 26,934 scientific documents published during the last three years, authored by 9,385 distinguished and respected scientists specializing in Engineering and Technology. This systematic approach underscores the depth of research and expert analysis that underpin the final ranking, setting a benchmark for academic excellence and relevance.

For a detailed explanation of the methodology used to calculate the ranking scores, including data sources and the criteria applied, please consult our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing at Great Lakes Symposium on VLSI (based on the number of publications) are:

Sunil P. Khatri (21 papers) published 3 papers at the last edition,
Enrico Macii (21 papers) absent at the last edition,
Fabrizio Lombardi (20 papers) published 3 papers at the last edition, 1 more than at the previous edition,
Massimo Poncino (20 papers) absent at the last edition,
Yong-Bin Kim (16 papers) published 1 paper at the last edition the same number as at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing at Great Lakes Symposium on VLSI (based on the number of publications) are:

Northeastern University (41 papers) published 5 papers at the last edition, 1 less than at the previous edition,
University of Pittsburgh (29 papers) published 1 paper at the last edition, 3 less than at the previous edition,
Tsinghua University (28 papers) published 5 papers at the last edition, 1 less than at the previous edition,
Polytechnic University of Turin (28 papers) published 2 papers at the last edition, 1 less than at the previous edition,
Texas A&M University (27 papers) published 3 papers at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 1.05% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 23.40% were posted by at least one author from the top 10 institutions publishing at the conference. Another 9.57% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 31.91% of all publications and 35.11% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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