Location: Cagliari , Italy
Submission deadline: 5/6/2022
Conference dates: 9/12/2022 - 9/14/2022
| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Electronics and Electrical Engineering | 165 | 42 | 92 | 9 |
| Engineering and Technology | 467 | 4 | 9 | 2 |
This ranking presents a comprehensive evaluation of scientific conferences in the field of Engineering and Technology. Compiled by Research.com, a prominent and trusted resource for science research data across all major disciplines since 2014, this ranking is designed to offer researchers, institutions, and professionals an authoritative reference for identifying impactful conferences in their domain.
The position of each conference in the ranking is determined by a unique bibliometric score developed by Research.com experts. This score is meticulously calculated based on the estimated h-index and the number of leading scientists who have participated in the conference over the preceding three years, providing a robust measure of scientific influence and reputational standing.
The ranking incorporates Impact Score values assembled as of 2024-11-27. The selection and assessment process encompassed a detailed review of over 2,262 conferences, following rigorous analysis of more than 26,934 scientific documents authored in the last three years by 9,385 esteemed scientists representing the area of Engineering and Technology. This multifaceted approach ensures that the ranking reflects both the breadth and quality of scholarly contributions observed at each event.
For a comprehensive overview of the methodology used to derive the ranking scores, please visit our Methodology Page.
A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing at RFID-Technologies and Applications (based on the number of publications) are:
The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing at RFID-Technologies and Applications (based on the number of publications) are:
The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2011 edition, 0.00% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 100.00% were posted by at least one author from the top 10 institutions publishing at the conference. Another 0.00% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 0.00% of all publications and 0.00% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
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University of Salento
University of Aveiro
University of Pisa
Auburn University
University of Pisa
University of Pisa
Tampere University
Ghent University
Tyndall National Institute
Rutgers, The State University of New Jersey
University of Cambridge
Heriot-Watt University
