The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Joel N. Ullom sits on this spectrum.
This scientist: 415 publications — 90th percentile
90% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 804 publications or more.
The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Joel N. Ullom sits on this spectrum.
This scientist: 41 D-Index — 31st percentile
31% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 107 D-Index or more.
Joel N. Ullom is affiliated with the National Institute of Standards and Technology in the United States. Their research spans multiple fields within physics and engineering, with a particular focus on superconducting device technology and applications in astronomy and particle detection.
Their main fields of study include:
Within these broader domains, they have specialized in several subfields such as:
The topics central to their work include:
Joel N. Ullom has contributed to numerous publications, with frequent appearances in specific venues such as:
Some of their recent papers, including publication years and venues, are:
Frequent collaborators of Joel N. Ullom include:
W. S. Holland;W. S. Holland;D. Bintley;E. L. Chapin;A. Chrysostomou
Joel N Ullom;Joel N Ullom;Douglas A Bennett
B. Alpert;M. Balata;D. Bennett;M. Biasotti;M. Biasotti
Emmanuel Schaan;Emmanuel Schaan;Simone Ferraro;Simone Ferraro;Stefania Amodeo;Nicholas Battaglia
J. N. Ullom;W. B. Doriese;G. C. Hilton;J. A. Beall
W B Doriese;K M Morgan;D A Bennett;E V Denison
Unknown
A. M. Clark;N. A. Miller;A. Williams;S. T. Ruggiero
Carl D. Reintsema;Jörn Beyer;Sae Woo Nam;Steve Deiker
Stefania Amodeo;Nicholas Battaglia;Emmanuel Schaan;Emmanuel Schaan;Simone Ferraro;Simone Ferraro
W. B. Doriese;J. N. Ullom;J. A. Beall;W. D. Duncan
J. A. B. Mates;D. T. Becker;D. A. Bennett;B. J. Dober
Sigurd Naess;Simone Aiola;Jason E. Austermann;Nick Battaglia
M. F. Cunningham;J. N. Ullom;T. Miyazaki;S. E. Labov
M. Malnou;M. Malnou;M.R. Vissers;J.D. Wheeler;J. Aumentado
Saptarshi Chaudhuri;Dale Li;Kent Irwin;Kent Irwin;Clint Bockstiegel
A. M. Clark;A. Williams;S. T. Ruggiero;M. L. van den Berg
Nicholas Galitzki;Aamir Ali;Kam S. Arnold;Peter C. Ashton;Peter C. Ashton
Omid Noroozian;Omid Noroozian;John A. B. Mates;Douglas A. Bennett;Justus A. Brevik
B. L. Zink;J. N. Ullom;J. A. Beall;K. D. Irwin
K D Irwin;M D Niemack;J Beyer;H M Cho
Nicholas Galitzki;Aamir Ali;Kam S. Arnold;Peter C. Ashton
P. A. Fisher;J. N. Ullom;M. Nahum
Galen C. O'Neil;Peter J. Lowell;Jason M. Underwood;Joel N. Ullom
J Uhlig;J Uhlig;W.B. Doriese;J.W. Fowler;D.S. Swetz
M. Hazumi;P. A.R. Ade;A. Adler;E. Allys
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