World's Best Scientists 2026 revealed!
Ultramicroscopy
H-index 25

Ultramicroscopy

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Physics 212 14 26 8
Materials Science 309 187 277 24
Chemistry 651 49 56 11

Additional Metrics

Number of Best Scientists*: 262
Documents by Best Scientists*: 334
Top 100 Ranked Scientists*: 4
SCIMAGO H-index: 142
SCIMAGO SJR: 0.716
Impact Factor: 2

Overview

Top Research Topics at Ultramicroscopy?

Ultramicroscopy covers a variety of subjects, including Optics, Analytical chemistry, Electron, Electron microscope and Transmission electron microscopy. Optics studies presented in Ultramicroscopy focus on topics such as Diffraction, Scanning transmission electron microscopy, Microscope, Resolution (electron density) and Electron diffraction. While it focused on Scanning transmission electron microscopy, it was also able to explore topics like Dark field microscopy and Scanning confocal electron microscopy.

The in-depth study on Electron diffraction also explores topics in the intersecting field of Crystallography. Many of the studies tackled connect Analytical chemistry with a similar field of study like Atom probe. While work presented in the journal provided substantial information on Electron, it also covered topics in Molecular physics, Scattering and Atomic physics.

The research on Electron microscope discussed in Ultramicroscopy draws on the closely related field of Microscopy. It is mostly focused on Transmission electron microscopy, specifically High-resolution transmission electron microscopy.

  • Optics (38.96%)
  • Analytical chemistry (15.42%)
  • Electron (13.67%)

What are the most cited papers published in the journal?

  • EMS-A software package for electron diffraction analysis and HREM image simulation in materials science (1783 citations)
  • Quantitative measurement of displacement and strain fields from HREM micrographs (1452 citations)
  • In situ site-specific specimen preparation for atom probe tomography. (1098 citations)

Research areas of the most cited articles at Ultramicroscopy:

The most cited articles are organized to reinforce research efforts on Optics, Analytical chemistry, Resolution (electron density), Electron and Electron microscope. The Optics research presented in the journal publications places emphasis on topics like Scanning transmission electron microscopy, Microscope, Diffraction, Microscopy and Transmission electron microscopy. The most cited papers facilitate discussions on Analytical chemistry that incorporate concepts from other fields like Molecular physics, Electron energy loss spectroscopy and Atom probe.

What topics the last edition of the journal is best known for?

  • Quantum mechanics
  • Optics
  • Electron

The previous edition focused in particular on these issues:

Ultramicroscopy is organized to address concerns in the fields of Transmission electron microscopy, Scanning transmission electron microscopy, Optics, Electron and Segmentation. The concepts on Transmission electron microscopy presented in the journal can also apply to other research fields, including Sample (material), Phase (waves), Beam (structure), Raster scan and Acceleration voltage. The journal explores issues in Scanning transmission electron microscopy which can be linked to other research areas like Single crystal, Texture (crystalline), Thin film, Background subtraction and Skyrmion.

It focused on Optics research but expanded to cover Cathode ray. It addresses concerns in Electron which are intertwined with other disciplines, such as Symmetry (physics), Rotational symmetry, Condensed matter physics, Diffraction and Local symmetry. While Segmentation is the focus of Ultramicroscopy, it also provided insights into the studies of Instrumentation (computer programming), Pixel, Cluster analysis, Spectral line and Linear least squares.

The most cited articles from the last journal are:

  • Extracting weak magnetic contrast from complex background contrast in plan-view FeGe thin films. (0 citations)
  • Displacement separation analysis from atomic-resolution images. (0 citations)
  • In my Good Books (0 citations)

Papers citation over time

A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing in Ultramicroscopy (based on the number of publications) are:

  • John M. Cowley (105 papers) absent at the last edition,
  • D. Van Dyck (72 papers) absent at the last edition,
  • Rafal E. Dunin-Borkowski (60 papers) absent at the last edition,
  • Leslie J. Allen (58 papers) absent at the last edition,
  • Peter Schattschneider (53 papers) absent at the last edition.

The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing in Ultramicroscopy (based on the number of publications) are:

  • Arizona State University (324 papers) absent at the last edition,
  • Max Planck Society (238 papers) absent at the last edition,
  • Centre national de la recherche scientifique (196 papers) absent at the last edition,
  • University of Antwerp (187 papers) published 1 paper at the last edition, 4 less than at the previous edition,
  • University of Oxford (183 papers) absent at the last edition.

The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2022 edition, 14.29% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 16.67% were posted by at least one author from the top 10 institutions publishing in the journal. Another 16.67% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 16.67% of all publications and 50.00% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Top Publications

  • Patterned probes for high precision 4D-STEM bragg measurements.

    Steven E Zeltmann;Alexander Müller;Karen C Bustillo;Benjamin Savitzky

    (2020)
    86 Citations
  • The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision.

    Elliot Padgett;Megan E. Holtz;Paul Cueva;Yu-Tsun Shao

    (2020)
    61 Citations
  • Fast-ADT: A fast and automated electron diffraction tomography setup for structure determination and refinement

    S Plana-Ruiz;S Plana-Ruiz;Y Krysiak;J Portillo;E Alig

    (2020)
    58 Citations
  • Event driven 4D STEM acquisition with a Timepix3 detector: microsecond dwell time and faster scans for high precision and low dose applications

    Daen Jannis;Christoph Hofer;Chuang Gao;Xiaobin Xie

    (2022)
    53 Citations
  • Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings.

    (2021)
    52 Citations
  • A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography.

    David Ren;Colin Ophus;Michael Chen;Laura Waller

    (2020)
    50 Citations
  • Contrast transfer and noise considerations in focused-probe electron ptychography.

    Colum M. O’Leary;Gerardo T. Martinez;Emanuela Liberti;Martin J. Humphry

    (2021)
    46 Citations
  • Sub-Sampled Imaging for STEM: Maximising Image Speed, Resolution and Precision Through Reconstruction Parameter Refinement.

    (2021)
    41 Citations

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Best Scientists Contributing to This Journal