Journal of Electronic Testing: Theory and Applications (JETTA)

Top Research Topics at Journal of Electronic Testing?

The objective of Journal of Electronic Testing is to combine knowledge in the areas of Electronic engineering, Algorithm, Electronic circuit, Fault (power engineering) and Embedded system. Journal of Electronic Testing features studies on Electronic engineering, including topics such as CMOS. The journal facilitates discussions on Algorithm that incorporate concepts from other fields like Test set, Set (abstract data type), Automatic test pattern generation and Benchmark (computing).

The majority of Electronic circuit studies presented zero in on Combinational logic. Fault (power engineering) research featured in the journal incorporates concerns from various other topics such as Process (computing) and Testability. The work on Embedded system tackled in Journal of Electronic Testing brings together disciplines like Fault tolerance, Software and Overhead (computing).

The concepts on Fault coverage presented in it can also apply to other research fields, including Stuck-at fault, Fault detection and isolation, Reliability engineering and Computer engineering. The research on Stuck-at fault featured in Journal of Electronic Testing combines topics in other fields like Fault indicator and Fault model. While work presented in the journal provided substantial information on Test compression, it also covered topics in Design for testing, Computer hardware and Test data.

• Electronic engineering (32.16%)
• Algorithm (22.50%)
• Electronic circuit (18.38%)

What are the most cited papers published in the journal?

• On-Line Testing for VLSI—A Compendium of Approaches (208 citations)
• A Formal Analysis of Fault Diagnosis with D-matrices (165 citations)
• Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead (139 citations)

Research areas of the most cited articles at Journal of Electronic Testing:

The journal papers are organized to address concerns in the fields of Electronic engineering, Algorithm, Fault (power engineering), Fault coverage and Automatic test pattern generation. The featured Electronic engineering studies in the published papers mainly concentrate on Electronic circuit but also cover areas of interest in Benchmark (computing) and Redundancy (engineering). In addition to Fault (power engineering) research, the published papers aim to explore topics under Real-time computing, Very-large-scale integration, Embedded system and Overhead (computing).

What topics the last edition of the journal is best known for?

• Operating system
• Electrical engineering
• Artificial intelligence

The previous edition focused in particular on these issues:

Electronic engineering, Static random-access memory, CMOS, Computer hardware and Algorithm are the subjects of interest in the journal. The journal explores topics in Electronic engineering which can be helpful for research in disciplines like DUAL (cognitive architecture), Floorplan, Leakage (electronics), Asynchronous communication and Robustness (computer science). While Static random-access memory is the focus of Journal of Electronic Testing, it also provided insights into the studies of Orbit (dynamics), Fault injection, Simulation and Reliability (semiconductor).

The research on Computer hardware tackled can also make contributions to studies in the areas of Overhead (computing), Logic gate, Hardware Trojan, Test data and SIMPLE (military communications protocol). The journal explores issues in Algorithm which can be linked to other research areas like Fault (power engineering), Elliptic curve, Homogeneous coordinates and VHDL. The presented Integrated circuit research focuses mostly on Design for testing and, on occasion, topics in Electronic circuit.

The most cited articles from the last journal are:

• Estimating Operational Age of an Integrated Circuit (1 citations)
• Radiation Tolerant SRAM Cell Design in 65nm Technology (1 citations)
• Decoupling Capacitor Estimation and Allocation using Optimization Techniques for Power Supply Noise Reduction in System-on-Chip (1 citations)

Papers citation over time

A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing in Journal of Electronic Testing (based on the number of publications) are:

• Vishwani D. Agrawal (28 papers) published 1 paper at the last edition the same number as at the previous edition,
• Patrick Girard (27 papers) published 1 paper at the last edition the same number as at the previous edition,
• Florence Azaïs (24 papers) published 1 paper at the last edition the same number as at the previous edition,
• Michel Renovell (24 papers) absent at the last edition,
• Krishnendu Chakrabarty (19 papers) absent at the last edition.

The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing in Journal of Electronic Testing (based on the number of publications) are:

• University of Montpellier (65 papers) published 2 papers at the last edition, 1 more than at the previous edition,
• Universidade Federal do Rio Grande do Sul (35 papers) published 3 papers at the last edition, 1 more than at the previous edition,
• Polytechnic University of Turin (34 papers) absent at the last edition,
• University of Texas at Austin (27 papers) absent at the last edition,
• Intel (27 papers) absent at the last edition.

The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 7.89% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 20.00% were posted by at least one author from the top 10 institutions publishing in the journal. Another 5.71% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 11.43% of all publications and 62.86% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.