Location: Hsinchu , Taiwan
Conference dates: 4/17/2023 - 4/20/2023
| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Electronics and Electrical Engineering | 606 | 18 | 27 | 3 |
This authoritative ranking presents a comprehensive list of scientific conferences specializing in Engineering and Technology. The ranking has been meticulously prepared by Research.com, a leading platform for science research information across all major disciplines. Since 2014, Research.com has been dedicated to providing reliable data on scientific contributions, earning the trust of the global academic community.
Each conference’s position within the ranking is based on a proprietary bibliometric score developed by Research.com. This score incorporates both the estimated h-index and the number of leading scientists who have participated in the conference during the preceding three years, ensuring that the ranking reflects not only scholarly impact, but also strong scientific engagement. The Impact Score values presented are based on data collected as of 2024-11-27.
The rigorous process for developing this ranking involved the examination of over 2,262 conferences, which were carefully curated following in-depth analysis of more than 26,934 scientific documents published within the past three years by 9,385 distinguished and respected scientists in the field of Engineering and Technology. This multi-stage evaluation ensures that the ranking reliably highlights conferences demonstrating the highest levels of influence, relevance, and scholarly contribution.
Further details on the methodology used to compute the ranking scores, including criteria and calculation procedures, are provided for full transparency and can be accessed on our Methodology Page.
A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing at International Symposium on VLSI Design, Automation and Test (based on the number of publications) are:
The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing at International Symposium on VLSI Design, Automation and Test (based on the number of publications) are:
The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2017 edition, 5.97% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 47.62% were posted by at least one author from the top 10 institutions publishing at the conference. Another 11.11% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 11.11% of all publications and 30.16% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
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Chinese University of Hong Kong
Washington State University
National Tsing Hua University
University of California, Irvine
National Taiwan University
National Tsing Hua University
Columbia University
IBM (United States)
Taiwan Semiconductor Manufacturing Company (Taiwan)
University of Tokyo
National Taiwan University
National Taiwan University