World's Best Scientists 2026 revealed!
IEEE

International Vacuum Electronics Conference (IVEC)

Location: Sichuan , China

Conference dates: 4/25/2023 - 4/28/2023

Research H-index
5

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 115 23 46 2
Electronics and Electrical Engineering 484 34 123 4
Engineering and Technology 247 12 44 3

Call for Papers

We invite you to submit papers with the results of your latest
work and experiences in the field of vacuum electronics.
Submissions from all groups are highly encouraged and
appreciated. IVEC 2023 strives to provide a unique platform
for exchanging scientific and technical information and foster
collaboration and cooperation in the vacuum electronics
domain at Asian and global levels.
IVEC 2023 will focus on the Development of Vacuum
Electronics for Requirements of the 21st Century as the
conference theme. A special highlight of IVEC 2023 will be
the introduction of Generalized Vacuum Electronics, which
will try to extend the electron radiation from traditional
vacuum to solid-state materials, as well as combine vacuum
technology with the semiconductor technology. IVEC 2023 is
the ideal forum to present and discuss the promising research
from this field with the wider vacuum electronics
community

Overview

This ranking showcases leading scientific conferences in the field of Engineering and Technology, offering a comprehensive view of their impact and academic prominence. Developed by Research.com, a distinguished platform recognized for providing reliable data on scientific research across major disciplines since 2014, this ranking serves as an authoritative resource for scholars and professionals seeking credible information on conference quality.

The ranking positions are determined by an exclusive bibliometric score constructed by Research.com. This score is meticulously computed using both the estimated h-index and the number of leading scientists who have participated in the conference during the last three years, providing a nuanced measure of scientific influence and engagement. The ranking includes Impact Score values as compiled on 2024-11-27, reflecting the most up-to-date academic contributions in the field.

The process of assembling this ranking was exceptionally thorough. A total of over 2,262 conferences were carefully selected after extensive examination and analysis, involving the review of more than 26,934 scientific documents published in the past three years by 9,385 distinguished and reputable scientists specializing in Engineering and Technology. This rigorous and data-driven approach underscores the credibility and depth of the resultant ranking, ensuring it reflects only the most influential and high-standard conferences in the domain.

For a detailed outline of the methodology utilized in calculating the conference ranking scores, please refer to our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Vacuum Electronics Conference (based on the number of publications) are:

  • Jinjun Feng (97 papers) published 11 papers at the last edition, 6 less than at the previous edition,
  • Baruch Levush (69 papers) published 3 papers at the last edition, 2 more than at the previous edition,
  • Yubin Gong (57 papers) published 13 papers at the last edition, 4 more than at the previous edition,
  • Khanh T. Nguyen (51 papers) published 4 papers at the last edition, 3 more than at the previous edition,
  • Bin Li (50 papers) published 9 papers at the last edition the same number as at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Vacuum Electronics Conference (based on the number of publications) are:

  • Chinese Academy of Sciences (170 papers) published 26 papers at the last edition, 19 less than at the previous edition,
  • University of Electronic Science and Technology of China (165 papers) published 39 papers at the last edition, 11 more than at the previous edition,
  • United States Naval Research Laboratory (117 papers) published 13 papers at the last edition, 4 more than at the previous edition,
  • Southeast University (52 papers) published 6 papers at the last edition, 2 more than at the previous edition,
  • Karlsruhe Institute of Technology (41 papers) published 13 papers at the last edition, 6 more than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 22.01% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 59.41% were posted by at least one author from the top 10 institutions publishing at the conference. Another 14.36% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 16.34% of all publications and 9.90% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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Best Scientists who published in this Conference