International Conference on Software Quality, Reliability and Security (QRS-C)

This ranking presents a comprehensive evaluation of scientific conferences in the field of Computer Science. Prepared by Research.com, one of the leading platforms for science research information across all major disciplines since 2014, this ranking reflects a commitment to providing reliable and expert-curated data on scientific contributions worldwide.

The position of each conference in this ranking is determined using a proprietary bibliometric score developed by Research.com. This unique score is calculated based on the estimated h-index and the number of leading scientists who have appeared at the conference during the last three years, offering a robust and nuanced assessment of conference impact and significance.

The ranking features Impact Score values compiled as of 2024-11-27, ensuring that the presented information is both current and relevant. The assessment process involved an exhaustive examination of more than 2,742 conferences, meticulously selected following a thorough review and rigorous evaluation of over 148,739 scholarly documents published in the last three years. These publications were authored by 13,184 prominent and highly respected scientists, underscoring the extensive breadth and depth of analysis undertaken by our expert team.

For a detailed explanation of the methodology and criteria employed in the computation of the ranking scores, please refer to our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing at IEEE International Conference on Software Quality, Reliability and Security Companion (based on the number of publications) are:

• Wei Dong (11 papers) published 6 papers at the last edition,
• Yun Lin (10 papers) published 1 paper at the last edition the same number as at the previous edition,
• Jianwen Xiang (10 papers) absent at the last edition,
• Jing Tian (7 papers) absent at the last edition,
• Tieke He (7 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing at IEEE International Conference on Software Quality, Reliability and Security Companion (based on the number of publications) are:

• Beihang University (42 papers) published 4 papers at the last edition, 2 less than at the previous edition,
• Nanjing University (31 papers) published 2 papers at the last edition, 10 less than at the previous edition,
• National University of Defense Technology (16 papers) published 6 papers at the last edition, 4 more than at the previous edition,
• Harbin Engineering University (16 papers) published 1 paper at the last edition the same number as at the previous edition,
• Chinese Academy of Sciences (15 papers) published 2 papers at the last edition, 2 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2020 edition, 9.91% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 25.00% were posted by at least one author from the top 10 institutions publishing at the conference. Another 19.00% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 14.00% of all publications and 42.00% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.