Location: Iguazu Falls , Brazil
Conference dates: 6/20/2023 - 6/23/2023
| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Electronics and Electrical Engineering | 138 | 58 | 126 | 10 |
The following ranking presents a comprehensive evaluation of scientific conferences within the field of Engineering and Technology. Prepared by Research.com, a leading platform recognized for delivering reliable and up-to-date scientific research insights since 2014, this ranking offers a trusted resource for assessing the academic impact and prestige of conferences in this domain.
The ranking methodology is built upon a proprietary bibliometric score uniquely developed by Research.com. The score combines the estimated h-index of conferences with the number of leading scientists who have contributed to each event during the last three years. This approach ensures a multifaceted assessment of conference quality, grounded in quantitative scientific achievement as well as expert participation.
Impact Score values presented in this ranking were collected on 2024-11-27, ensuring that the information reflects the latest advancements and scientific contributions. The rigorous analysis encompassed a meticulous review of over 2,262 conferences, which were carefully selected following detailed inspection and critical evaluation. The process included the examination of more than 26,934 scientific documents published over the previous three years by 9,385 distinguished and widely respected scientists in Engineering and Technology.
This ranking stands as a testament to the depth of research and thorough analysis performed by subject matter experts, highlighting the most influential conferences shaping the future of Engineering and Technology. For a comprehensive explanation of the methodology and calculation procedures underpinning the ranking scores, please refer to our Methodology Page.
A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing at IEEE Computer Society Annual Symposium on VLSI (based on the number of publications) are:
The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing at IEEE Computer Society Annual Symposium on VLSI (based on the number of publications) are:
The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2017 edition, 6.78% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 13.64% were posted by at least one author from the top 10 institutions publishing at the conference. Another 12.73% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 17.27% of all publications and 56.36% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
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Nanjing University
University of Tennessee at Knoxville
University of Cincinnati
Tsinghua University
Hong Kong University of Science and Technology
University of Florida
Pennsylvania State University
University of Illinois at Urbana-Champaign
East China Normal University
University of Tennessee at Knoxville
Imec
NTT (Japan)
