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IEEE

IEEE 6th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC 2022) (IAEAC)

Location: Beijing , China

Conference dates: 10/3/2022 - 10/5/2022

Research H-index
5

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 599 19 23 3
Engineering and Technology 179 11 11 4
Mechanical and Aerospace Engineering 124 3 5 1

Call for Papers

2022 IEEE 6th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC 2022) will be held on October 3-5, 2022 in Beijing China. This conference is sponsored by IEEE and Chongqing Global Union Academy of Science and Technology. Submitted conference papers will be reviewed by at least two technical program committee members and sub reviewers assigned by PC members of the Conference.All accepted papers will be published by IEEE,which will be submitted to EI index.Excellent papers will be selected and published on SCI and EI journals.

The aim of IAEAC 2022 is to provide a platform for researchers, engineers, academicians as well as industrial professionals from all over the world to present their research results and development activities in Information Technology,Communicates,Network,Electronic and Automation Control. It provides opportunities for the delegates to exchange new ideas and application experiences, to establish business or research relations and to find global partners for future collaboration.

Overview

This ranking presents a comprehensive listing of scientific conferences within the field of Engineering and Technology, meticulously curated by Research.com, a prominent resource for trusted data on scientific research across all major disciplines. Since 2014, Research.com has established itself as a leading authority in providing transparent and reliable insights into scholarly contributions, with particular emphasis on Engineering and Technology.

The conference positions in this ranking are determined by an exclusive bibliometric score, developed by Research.com. This score is calculated through a robust methodology combining the estimated h-index and the number of leading scientists participating in each conference over the course of the last three years. By integrating these indicators, the ranking offers a nuanced view of conference influence and scientific impact within the community.

Impact Score values included in this ranking were collected as of 2024-11-27, ensuring that the data reflects the most recent and relevant developments in the field. The ranking process itself encompassed a thorough review of more than 2,262 conferences, selected after detailed inspection and rigorous analysis of over 26,934 scientific documents published within the previous three years. The assessment involved contributions from 9,385 leading and widely respected scientists, affirming the depth and integrity of the evaluation.

For a deeper understanding of the methodologies employed in calculating ranking scores, readers are encouraged to consult our Methodology Page, where extensive details on the analytical processes are provided.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at IEEE Advanced Information Technology, Electronic and Automation Control Conference (based on the number of publications) are:

  • Bing Yao (13 papers) published 3 papers at the last edition,
  • Xinhua Liu (10 papers) published 3 papers at the last edition,
  • Jin Pan (9 papers) published 2 papers at the last edition,
  • Hong Lu (8 papers) published 8 papers at the last edition,
  • Linhua Piao (8 papers) published 1 paper at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at IEEE Advanced Information Technology, Electronic and Automation Control Conference (based on the number of publications) are:

  • Electric Power Research Institute (113 papers) published 15 papers at the last edition,
  • Wuhan University of Technology (93 papers) published 23 papers at the last edition,
  • National University of Defense Technology (84 papers) published 7 papers at the last edition,
  • Chinese Academy of Sciences (53 papers) published 11 papers at the last edition,
  • Communication University of China (50 papers) published 5 papers at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 26.01% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 26.04% were posted by at least one author from the top 10 institutions publishing at the conference. Another 21.09% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 21.35% of all publications and 31.51% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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