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IEEE

IEEE 2022 International Conference on Dielectrics (ICD)

Location: Palermo , Italy

Submission deadline: 10/21/2021

Conference dates: 7/3/2022 - 7/7/2022

Research H-index
4

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 114 23 49 2
Electronics and Electrical Engineering 602 18 52 3

Call for Papers

The fourth edition of a series of biennial international Conferences on Dielectrics, fully sponsored by IEEE Dielectrics and Electrical Insulation Society, will take place in Palermo, Italy, from Sunday 3rd until Thursday 7th July 2022. The ICD is an interdisciplinary forum that provides a unique opportunity for researchers from industry, academia and research centers to come together to review their research activities.

We warmly invite you to attend and to contribute to the 4th International Conference on Dielectrics to be held In Palermo, Italy. The conference will run for four full days and one half day. Tutorial sessions will be held on the first day of the conference. Papers are invited in all areas of solid, liquid and gas dielectrics. Special attention is given to topics focusing on the interfaces between solids, liquids and gases.

Overview

This ranking presents a comprehensive evaluation of scientific conferences within the discipline of Electronics and Electrical Engineering. Compiled by Research.com—a leading authority in providing trusted data on scientific contributions across major academic fields since 2014—this ranking embodies a rigorous and transparent approach to conference assessment.

The position of each conference in this ranking is determined by a unique bibliometric score, meticulously developed by Research.com. This score is calculated using a combination of the estimated h-index and the number of leading scientists who have participated in the conference during the three most recent years. By integrating multiple facets of scientific impact, the ranking achieves a robust and multidimensional perspective on conference excellence.

Impact Score values reflected in this ranking were gathered as of 2024-11-27, guaranteeing the use of the most current and relevant data available. The selection process was exceptionally extensive: more than 2,204 conferences were examined in detail following a rigorous review of over 95,378 scientific documents published within the last three years by 6,160 eminent scientists active in Electronics and Electrical Engineering. This depth of analysis underscores the reliability and authority of the resulting rankings.

Further information regarding the methodology used to compute the ranking scores—including definitions, algorithms, and selection criteria—is thoroughly detailed on our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at IEEE International Conference on Dielectrics (based on the number of publications) are:

  • Boxue Du (66 papers) published 27 papers at the last edition, 3 more than at the previous edition,
  • Jin Li (38 papers) published 15 papers at the last edition, 1 more than at the previous edition,
  • Gilbert Teyssedre (23 papers) published 8 papers at the last edition the same number as at the previous edition,
  • Alun Vaughan (22 papers) published 6 papers at the last edition the same number as at the previous edition,
  • Shengtao Li (19 papers) published 9 papers at the last edition, 3 more than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at IEEE International Conference on Dielectrics (based on the number of publications) are:

  • Tianjin University (76 papers) published 35 papers at the last edition, 9 more than at the previous edition,
  • Xi'an Jiaotong University (73 papers) published 21 papers at the last edition, 2 more than at the previous edition,
  • Electric Power Research Institute (47 papers) published 19 papers at the last edition, 9 more than at the previous edition,
  • University of Southampton (39 papers) published 12 papers at the last edition, 3 less than at the previous edition,
  • University of Toulouse (33 papers) published 9 papers at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2020 edition, 4.82% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 49.31% were posted by at least one author from the top 10 institutions publishing at the conference. Another 11.98% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 15.21% of all publications and 23.50% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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