World's Best Scientists 2026 revealed!
IEEE

Design, Automation, and Test in Europe Conference (DATE)

Location: Antwerp , Belgium

Conference dates: 4/17/2023 - 4/19/2023

Research H-index
31

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 14 194 547 27
Computer Science 66 253 660 29

Call for Papers

Track D: Design Methods and Tools addresses
design automation, design tools and hardware architectures for electronic and embedded systems.
The emphasis is on methods, algorithms and tools
related to the use of computers in designing complete systems. The track focus includes significant
improvements on existing design methods and
tools as well as forward-looking approaches to model and design future system architectures, design
flows and environments.
Lukas Sekanina (Brno University of Technology, CZ)
This track is organised in the following topics:
D1 System Specification and Modelling
D2 System-Level Design Methodologies and
High-Level-Synthesis
D3 System Simulation and Validation
DT4 Design and Test for Analogue and Mixed-
Signal Circuits and Systems, and MEMS
DT5 Design and Test of Hardware Security
Primitives
DT6 Design and Test of Secure Systems
D7 Formal Methods and Verification
D8 Network-on-Chip and on-chip
communication
D9 Architectural and Microarchitectural
Design
D10 Low-power, Energy-efficient and
Thermal-aware Design
D11 Approximate Computing
D12 Reconfigurable Systems
D13 Logical and Physical Analysis and Design
D14 Emerging Design Technologies for
Future Computing
D15 Emerging Design Technologies for
Future Memories

Track A: Application Design is devoted to the
presentation and discussion of design experiences
with a high degree of industrial relevance, realworld implementations and applications of specific design and test methodologies. Contributions
should illustrate innovative or record-breaking
design and test methodologies, which will provide
viable solutions in tomorrow’s silicon, embedded
systems and large-scale systems. In topic A8, there is the opportunity to submit 2-page papers that
expose industrial research and practice.
Alberto Bosio (University of Lyon, FR)

This track is organised in the following topics:
A1 Power-efficient and Sustainable Computing
A2 Smart Cities, Internet of Everything, Industry 4.0
A3 Automotive Systems and Smart Energy Systems
A4 Augmented Living and Personalized Healthcare
A5 Secure Systems, Circuits, and Architectures
A6 Self-adaptive and Context-aware Systems
A7 Applications of Emerging Technologies
A8 Industrial Experiences Brief Papers

Track T: Test and Dependability covers all test,
design-for-test, reliability and design-for-robustness issues, at system-, chip-, circuit- and devicelevel for both analogue and digital electronics. Topics of interest also include diagnosis, failure mode
analysis, debug and post-silicon validation challenges and test or fault injection methods addressing
system security.
Ilia Polian (University of Stuttgart, DE)
This track is organised in the following topics:
T1 Modelling and Mitigation of Defects, Faults,
Variability, and Reliability
T2 Test Generation, Test Architectures,
Design for Test, and Diagnosis
T3 Dependability and System-Level Test
DT4 Design and Test for Analogue and
Mixed-Signal Circuits and Systems, and MEMS
DT5 Design and Test of Hardware Security Primitives
DT6 Design and Test of Secure Systems

Track E: Embedded Systems Design is devoted
to the modelling, analysis, design, verification and
deployment of embedded software or embedded/
cyber-physical systems. Areas of interest include
methods, tools, methodologies and development
environments for real-time systems, cyber-physical
systems, networked systems and dependable systems. Emphasis is, also, on model-based design and
verification, embedded software platforms, software compilation and integration for these systems.
Liliana Cucu (Inria, FR)
This track is organised in the following topics:
E1 Embedded Software Architecture, Compilers
and Tool Chains
E2 Real-time, Dependable and Privacy-Enhanced
Systems
E3 Machine Learning Solutions for Embedded and
Cyber-Physical Systems
E4 Design Methodologies for Machine Learning
Architectures
E5 Design Modelling and Verification for Embedded and Cyber-Physical Systems

Overview

The scientific conference ranking presented on this page offers a comprehensive and authoritative assessment of conferences in the field of Computer Science. Developed by Research.com, a leading website widely recognized for providing reliable data and in-depth analysis on scientific achievements across numerous fields—including Computer Science—this ranking draws on a decade of trusted expertise, with Research.com serving the scientific community since 2014.

Each conference’s position in this ranking is determined using a unique bibliometric score devised by Research.com’s expert team. This score is meticulously computed based on two primary criteria: the estimated h-index of the conference and the number of leading scientists who have actively contributed to the conference during the last three years. The resulting Impact Score values provide a robust and insightful measure of conference influence and were gathered as of 2024-11-27.

The process underlying the creation of this ranking is both rigorous and sophisticated. Initially, over 2,742 conferences were meticulously selected for detailed evaluation following an extensive inspection and analysis of more than 148,739 scientific documents. These contributions represent the work of 13,184 leading and highly respected scientists in the Computer Science domain, ensuring the ranking reflects the most impactful and scientifically valuable conferences in the field.

To promote full transparency and academic rigor, a thorough explanation of the methodology, including details on the computation of the ranking scores, can be found on our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at Design, Automation, and Test in Europe (based on the number of publications) are:

  • Luca Benini (67 papers) published 7 papers at the last edition, 1 more than at the previous edition,
  • Jorg Henkel (57 papers) published 7 papers at the last edition, 2 more than at the previous edition,
  • Muhammad Shafique (46 papers) published 6 papers at the last edition, 1 more than at the previous edition,
  • Giovanni De Micheli (43 papers) published 4 papers at the last edition, 1 more than at the previous edition,
  • Massoud Pedram (36 papers) published 2 papers at the last edition, 1 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at Design, Automation, and Test in Europe (based on the number of publications) are:

  • École Polytechnique Fédérale de Lausanne (110 papers) published 9 papers at the last edition the same number as at the previous edition,
  • Karlsruhe Institute of Technology (108 papers) published 11 papers at the last edition, 1 less than at the previous edition,
  • Polytechnic University of Turin (84 papers) published 6 papers at the last edition, 2 more than at the previous edition,
  • Technische Universität München (80 papers) published 10 papers at the last edition, 1 more than at the previous edition,
  • Katholieke Universiteit Leuven (79 papers) published 6 papers at the last edition, 1 more than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2019 edition, 1.79% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 19.45% were posted by at least one author from the top 10 institutions publishing at the conference. Another 10.33% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 21.58% of all publications and 48.63% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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Best Scientists who published in this Conference

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