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2022 IEEE INTERNATIONAL WORKSHOP ON  Metrology for AeroSpace

2022 IEEE INTERNATIONAL WORKSHOP ON Metrology for AeroSpace

Pisa , Italy

Submission Deadline: Sunday 23 Jan 2022

Conference Dates: Jun 27, 2022 - Jun 29, 2022

Research
Impact Score 0.40

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Ranking & Metrics Impact Score is a novel metric devised to rank conferences based on the number of contributing the best scientists in addition to the h-index estimated from the scientific papers published by the best scientists. See more details on our methodology page.

Research Impact Score: 0.40
Contributing Best Scientists: 9
H5-index:
Papers published by Best Scientists 2
Research Ranking (Electronics and Electrical Engineering) 706
Research Ranking (Environmental Sciences) 19

Conference Call for Papers

The main topics include, but are not limited to:
• Electronic instrumentation for aerospace
• Automatic test equipment for aerospace
• Sensors and sensor systems for aerospace
• Wireless sensor networks in aerospace
• Attitude - and heading - reference systems
• Monitoring systems in aerospace
• Metrology for navigation and precise positioning
• Sensors and Data Fusion Techniques

Overview

Top Research Topics at IEEE International Workshop on Metrology for AeroSpace?

  • Aerospace engineering (10.32%)
  • Real-time computing (9.38%)
  • Remote sensing (8.86%)

The concepts of Aerospace engineering, Real-time computing, Remote sensing, Satellite and Electronic engineering are tackled in the conference. Aerospace engineering research presented is mostly focused on the subject of Spacecraft. The study on Real-time computing presented is investigated in conjunction with research in GNSS applications.

What are the most cited papers published at the conference?

  • The PLATO Mission (57 citations)
  • Avionics Sensor Fusion for Small Size Unmanned Aircraft Sense-and-Avoid (43 citations)
  • A Laser Obstacle Warning and Avoidance system for Manned and Unmanned Aircraft (33 citations)

Research areas of the most cited articles at IEEE International Workshop on Metrology for AeroSpace:

The published articles investigate studies in Reliability engineering, Aerospace, Electronic engineering, Artificial intelligence and Drone. The conference articles about Prognostics are all disciplines of Reliability engineering that connect with topics in Operator (computer programming). The works on Artificial intelligence tackled in the conference publications bring together disciplines like Sensitivity (control systems) and Pattern recognition.

What topics the last edition of the conference is best known for?

  • Artificial intelligence
  • Electrical engineering
  • Mechanical engineering

The previous edition focused in particular on these issues:

The conference generally zeroes in on subjects such as Metrology, Aerospace engineering, Real-time computing, Satellite and Aerospace. IEEE International Workshop on Metrology for AeroSpace features Metrology research that overlaps with concepts in Aerodynamics. The featured Aerospace engineering works encompass concepts such as Space exploration, Propulsion and Spacecraft and examines them in conjunction with Context (language use).

Many of the studies tackled connect Real-time computing with a similar field of study like GNSS applications. More specifically, the research on Satellite in it is related to CubeSat.

The most cited articles from the last conference are:

  • IMUMETER - AI-Based Sensor for Airplane Motion Measurements (1 citations)
  • Satellite-derived Time for Enhanced Telecom Networks Synchronization: the ROOT Project (1 citations)
  • Experimental Validation of a Deployment Mechanism for Tape-tethered Satellites (1 citations)

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Research.com

The top authors publishing at IEEE International Workshop on Metrology for AeroSpace (based on the number of publications) are:

  • Fabio Leccese (39 papers) published 4 papers at the last edition, 2 less than at the previous edition,
  • Stefano Debei (37 papers) published 1 paper at the last edition, 1 less than at the previous edition,
  • Diego Scaccabarozzi (24 papers) published 5 papers at the last edition,
  • Jerzy Józwik (24 papers) published 4 papers at the last edition, 2 less than at the previous edition,
  • Bortolino Saggin (23 papers) published 5 papers at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Research.com

Only papers with recognized affiliations are considered

The top affiliations publishing at IEEE International Workshop on Metrology for AeroSpace (based on the number of publications) are:

  • University of Naples Federico II (77 papers) published 18 papers at the last edition, 1 less than at the previous edition,
  • University of Padua (67 papers) published 8 papers at the last edition, 2 more than at the previous edition,
  • INAF (64 papers) published 7 papers at the last edition, 6 more than at the previous edition,
  • University of Sannio (51 papers) absent at the last edition,
  • Roma Tre University (46 papers) published 6 papers at the last edition the same number as at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Research.com

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

Research.com

During the most recent 2021 edition, 9.92% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 55.93% were posted by at least one author from the top 10 institutions publishing at the conference. Another 16.95% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 16.10% of all publications and 11.02% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Research.com

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

Research.com

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

Research.com

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Research.com

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Previous Editions

2022 IEEE INTERNATIONAL WORKSHOP ON  Metrology for AeroSpace

Jun 27, 2022 - Jun 29, 2022

Pisa , Italy, Italy

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