2023 - Research.com Computer Science in China Leader Award
2009 - IEEE Fellow For contributions to face recognition, pattern recognition and computer vision
Stan Z. Li mainly investigates Artificial intelligence, Pattern recognition, Computer vision, Facial recognition system and Face. His study connects Machine learning and Artificial intelligence. His Pattern recognition research incorporates elements of Histogram, Local binary patterns and Feature.
He combines subjects such as Detector and Benchmark with his study of Computer vision. His biological study spans a wide range of topics, including Artificial neural network, Liveness, Quotient and Biometrics. His Face research is multidisciplinary, incorporating elements of Principal component analysis, Image, Representation and Convolutional neural network.
Stan Z. Li mainly focuses on Artificial intelligence, Pattern recognition, Computer vision, Facial recognition system and Face. His work in Artificial intelligence addresses subjects such as Machine learning, which are connected to disciplines such as Benchmark. His Pattern recognition study integrates concerns from other disciplines, such as Contextual image classification, Subspace topology and Feature.
His work on Computer vision is being expanded to include thematically relevant topics such as Robustness. His Facial recognition system research focuses on Biometrics and how it relates to Data science. The study incorporates disciplines such as Representation, Modality, Image and Deep learning in addition to Face.
His main research concerns Artificial intelligence, Facial recognition system, Face, Pattern recognition and Machine learning. Stan Z. Li works mostly in the field of Artificial intelligence, limiting it down to topics relating to Computer vision and, in certain cases, Robustness. His research in the fields of Anti spoofing overlaps with other disciplines such as Modalities.
He has researched Face in several fields, including Modality, Image and Code. His Pattern recognition research is multidisciplinary, incorporating perspectives in RGB color model, False positive paradox and Margin. His study in Machine learning is interdisciplinary in nature, drawing from both Perspective and Generalization.
Stan Z. Li spends much of his time researching Artificial intelligence, Face, Machine learning, Pattern recognition and Facial recognition system. His Artificial intelligence research is multidisciplinary, relying on both Generalization and Computer vision. Stan Z. Li interconnects Image and Code in the investigation of issues within Face.
His Machine learning research includes elements of Biometrics, Graph, Graph and Benchmark. His Pattern recognition research incorporates themes from Margin and Cluster analysis. His research investigates the connection between Facial recognition system and topics such as Spoofing attack that intersect with issues in Attack model, Replay attack and RGB color model.
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Handbook of Face Recognition
Stan Z. Li;Anil K. Jain.
(2011)
Markov Random Field Modeling in Image Analysis
Stan Z. Li.
(2001)
Markov random field models in computer vision
Stan Z. Li.
european conference on computer vision (1994)
Person re-identification by Local Maximal Occurrence representation and metric learning
Shengcai Liao;Yang Hu;Xiangyu Zhu;Stan Z. Li.
computer vision and pattern recognition (2015)
Learning Face Representation from Scratch
Dong Yi;Zhen Lei;Shengcai Liao;Stan Z. Li.
arXiv: Computer Vision and Pattern Recognition (2014)
Markov Random Field Modeling in Computer Vision
S. Z. Li.
(1995)
Deep Metric Learning for Person Re-identification
Dong Yi;Zhen Lei;Shengcai Liao;Stan Z. Li.
international conference on pattern recognition (2014)
Learning spatially localized, parts-based representation
S.Z. Li;Xin Wen Hou;Hong Jiang Zhang;Qian Sheng Cheng.
computer vision and pattern recognition (2001)
Single-Shot Refinement Neural Network for Object Detection
Shifeng Zhang;Longyin Wen;Xiao Bian;Zhen Lei.
computer vision and pattern recognition (2018)
Face Alignment Across Large Poses: A 3D Solution
Xiangyu Zhu;Zhen Lei;Xiaoming Liu;Hailin Shi.
computer vision and pattern recognition (2016)
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