The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Ronn Andriessen sits on this spectrum.
This scientist: 89 publications — 5th percentile
5% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 804 publications or more.
The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Ronn Andriessen sits on this spectrum.
This scientist: 40 D-Index — 27th percentile
27% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 107 D-Index or more.
Ronn Andriessen is affiliated with the Netherlands Organisation for Applied Scientific Research in the Netherlands. Their research primarily spans the fields of Engineering and Materials Science, with specific subfields including Electrical and Electronic Engineering, Materials Chemistry, and Polymers and Plastics.
The scientist's work centers on topics related to Perovskite Materials and Applications, Advanced Memory and Neural Computing, ZnO doping and properties, Chalcogenide Semiconductor Thin Films, Silicon and Solar Cell Technologies, Quantum Dots Synthesis and Properties, and Conducting polymers and applications.
Ronn Andriessen has contributed to several recent papers, notable among them are:
Their frequent coauthors include:
Ronn Andriessen has published across various venues, with at least one publication in each of the following:
Nadia Grossiord;Jan M. Kroon;Ronn Andriessen;Paul W. M. Blom
Yulia Galagan;Jan-Eric J.M. Rubingh;Ronn Andriessen;Chia-Chen Fan
Tom Aernouts;Peter Vanlaeke;Wim Geens;Jef Poortmans
T. Martens;J. D’Haen;T. Munters;Z. Beelen
T. M. Eggenhuisen;Y. Galagan;A. F. K. V. Biezemans;A. F. K. V. Biezemans;T. M. W. L. Slaats
Francesco Di Giacomo;Santhosh Shanmugam;Henri Fledderus;Bardo J. Bruijnaers
Yulia Galagan;Francesco Di Giacomo;Harrie Gorter;Gerwin Kirchner
V. Zardetto;B.L. Williams;A. Perrotta;F. Di Giacomo
Frederik C. Krebs;Jan Fyenbo;David M. Tanenbaum;Suren A. Gevorgyan
Yulia Galagan;Ike G. de Vries;Arjan P. Langen;Ronn Andriessen
Roland Rösch;David Tanenbaum;David Tanenbaum;Mikkel Jørgensen;Marco Seeland
Charles Owens;Gretta Mae Ferguson;Martin Hermenau;Eszter Voroshazi
Yinghuan Kuang;Valerio Zardetto;Roderick van Gils;Saurabh Karwal
J.M. Kroon;S.C. Veenstra;R. Andriessen;Y. Galagan
Yulia Galagan;Birger Zimmermann;Erica W.C. Coenen;Mikkel Jørgensen
Mehrdad Najafi;Francesco Di Giacomo;Dong Zhang;Santhosh Shanmugam
Yulia Galagan;Erica W.C. Coenen;Robert Abbel;Tim J. van Lammeren
Y. Galagan;E. W. C. Coenen;W. J. H. Verhees;Ronn Andriessen
David M. Tanenbaum;David M. Tanenbaum;Martin Hermenau;Eszter Voroshazi;Matthew T. Lloyd
Gerwin H. Gelinck;Abhishek Kumar;Date Moet;Jan Laurens Van Der Steen
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