World's Best Scientists 2026 revealed!
Anand Asundi

Anand Asundi

D-Index & Metrics

Engineering and Technology

D-Index
62
Citations
20692
World Ranking
1847
National Ranking
27

Research.com Recognitions

  • 1998 - SPIE Fellow

Overview

Anand Asundi is affiliated with d'Optron Pte in Singapore and has contributed extensively to the fields of Physics and Astronomy, Engineering, and Computer Science. Their academic work spans several subfields including Computer Vision and Pattern Recognition, Atomic and Molecular Physics and Optics, Media Technology, Radiation, and Acoustics and Ultrasonics.

Their research focuses on a range of topics, including optical measurement and interference techniques, advanced X-ray imaging techniques, random lasers and scattering media, advanced optical imaging technologies, digital holography and microscopy, orbital angular momentum in optics, and image processing techniques and applications.

Notable recent publications include:

  • Wide-field high-resolution 3D microscopy with Fourier ptychographic diffraction tomography, 2020, Optics and Lasers in Engineering
  • Wrapped phase denoising using convolutional neural networks, 2020, Optics and Lasers in Engineering
  • An optical image encryption based on computational ghost imaging with sparse reconstruction, 2021, Optics and Lasers in Engineering
  • Emerging tunable window technologies for active transparency tuning, 2022, Applied Physics Reviews
  • Dielectric Elastomer Actuator-Based Multifunctional Smart Window for Transparency Tuning and Noise Absorption, 2021, Actuators

Frequent co-authors collaborating with Anand Asundi include Liansheng Sui, Yingjie Yu, Zhaolin Xiao, Qian Kemao, and Ying Cheng.

Key publication venues for their work have been Optics and Lasers in Engineering, Applied Physics Reviews, Actuators, Optics Communications, and Optics Express.

In recognition of their contributions, they were named an SPIE Fellow in 1998.

Best Publications

  • Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review

    Bing Pan;Kemao Qian;Huimin Xie;Anand Asundi

  • Temporal phase unwrapping algorithms for fringe projection profilometry: A comparative review

    Chao Zuo;Lei Huang;Minliang Zhang;Qian Chen

  • Digital image correlation using iterative least squares and pointwise least squares for displacement field and strain field measurements

    Bing Pan;Bing Pan;Anand Asundi;Huimin Xie;Jianxin Gao

  • Fiber metal laminates: An advanced material for future aircraft

    Anand Asundi;Alta Y.N. Choi

  • Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry

    Bing Pan;Qian Kemao;Lei Huang;Anand Asundi

  • Quality-guided phase unwrapping technique: comparison of quality maps and guiding strategies

    Ming Zhao;Lei Huang;Qican Zhang;Xianyu Su

  • High-resolution transport-of-intensity quantitative phase microscopy with annular illumination

    Chao Zuo;Jiasong Sun;Jiaji Li;Jialin Zhang

  • Structural health monitoring of smart composite materials by using EFPI and FBG sensors

    Jinsong Leng;Jinsong Leng;Anand Asundi

  • Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry

    Lei Huang;Qian Kemao;Bing Pan;Anand Krishna Asundi

  • Transport of intensity phase retrieval and computational imaging for partially coherent fields: The phase space perspective

    Chao Zuo;Chao Zuo;Qian Chen;Lei Tian;Laura Waller

  • Studies of digital microscopic holography with applications to microstructure testing

    Lei Xu;Xiaoyuan Peng;Jianmin Miao;Anand K. Asundi

  • Micro Fourier Transform Profilometry ($μ$FTP): 3D shape measurement at 10,000 frames per second

    Chao Zuo;Tianyang Tao;Shijie Feng;Lei Huang

  • Review of phase measuring deflectometry

    Lei Huang;Mourad Idir;Chao Zuo;Anand Asundi

  • High-speed transport-of-intensity phase microscopy with an electrically tunable lens.

    Chao Zuo;Qian Chen;Weijuan Qu;Anand Asundi

  • Fast phase-unwrapping algorithm based on a gray-scale mask and flood fill.

    Anand Asundi;Zhou Wensen

  • Wide-field high-resolution 3D microscopy with Fourier ptychographic diffraction tomography

    Chao Zuo;Jiasong Sun;Jiaji Li;Anand Asundi

  • Measurement of coefficient of thermal expansion of films using digital image correlation method

    Pan Bing;Xie Hui-min;Hua Tao;Anand Asundi

  • Phase aberration compensation in digital holographic microscopy based on principal component analysis.

    Chao Zuo;Qian Chen;Weijuan Qu;Anand Krishna Asundi

  • Transport-of-intensity phase imaging using Savitzky-Golay differentiation filter--theory and applications.

    Chao Zuo;Qian Chen;Yingjie Yu;Anand Krishna Asundi

  • A strain gauge and photoelastic analysis of in vivo strain and in vitro stress distribution in human dental supporting structures

    Anand Asundi;Anil Kishen

  • Real-time cure monitoring of smart composite materials using extrinsic Fabry-Perot interferometer and fiber Bragg grating sensors

    J S Leng;J S Leng;A Asundi

Frequent Co-Authors

Chao Zuo
Chao Zuo Nanjing University of Science and Technology
Qian Chen
Qian Chen Nanjing University of Science and Technology
Lei Huang
Lei Huang Sichuan University
Huimin Xie
Huimin Xie Tsinghua University
Jianmin Miao
Jianmin Miao Shanghai Jiao Tong University
Qian Kemao
Qian Kemao Nanyang Technological University
Ai Qun Liu
Ai Qun Liu Hong Kong Polytechnic University
Shijie Feng
Shijie Feng Nanjing University of Science and Technology
Swee Chuan Tjin
Swee Chuan Tjin Nanyang Technological University
Nam-Trung Nguyen
Nam-Trung Nguyen Griffith University

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