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Journal of Integrated Circuits and Systems
H-index 4

Journal of Integrated Circuits and Systems

1807-1953

Published by: Brazilian Computer Society

http://ojs.fei.edu.br/ojs/index.php/JICS

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 471 19 27 4

Additional Metrics

Number of Best Scientists*: 28
Documents by Best Scientists*: 39
Top 100 Ranked Scientists*: 0
SCIMAGO H-index: 14
SCIMAGO SJR: 0.166
Impact Factor: N/A

Top Publications

  • Study Of MOS Capacitors With TiO2 And SiO2/TiO2 Gate Dielectric

    (2020)
    39 Citations
  • Extraction of Mobility Degradation and Source-and-Drain Resistance in MOSFETs

    (2020)
    9 Citations
  • Survey on Near-Data Processing: Applications and Architectures

    Paulo Cesar Santos;Francis Birck Moreira;Aline Santana Cordeiro;Sairo Raoní Santos

    (2021)
    9 Citations
  • 3-D TCAD Monte Carlo Device Simulator: State-of-the-art FinFET Simulation

    Gabriela Firpo Furtado;Vinícius Valduga de Almeida Camargo;Dragica Vasileska;Gilson Inácio Wirth

    (2021)
    5 Citations
  • Using the Hexagonal Layout Style for MOSFETs to Boost the Device Matching in Ionizing Radiation Environments

    (2020)
    4 Citations
  • The Implications of Ferroelectric FET Device Models to the Design of Computing-in-Memory Architectures

    Dayane Reis;Michael Niemier;Xiaobo Sharon Hu

    (2021)
    3 Citations
  • Bias Stress in Organic Thin-Film Transistors Towards Low-Cost Flexible Gas Sensors

    José Enrique Eirez Izquierdo;José Diogo da Silva Oliveira;Vinicius Augusto Machado Nogueira;Dennis Cabrera García

    (2021)
    3 Citations
  • Ensemble Monte Carlo Simulation of Hole Transport in SiGe Alloys

    Caroline dos Santos Soares;Gilson Inácio Wirth;Alan Rossetto;Dragica Vasileska

    (2021)
    2 Citations
  • Role of Structural Parameters on the Leaky Electronic States in the Continuum of Superlattice Structures

    Pedro Henrique Pereira;Germano Maioli Penello;Mauricio Pamplona Pires;Manfred Helm

    (2020)
    2 Citations
  • Effects of Thermal Annealing on the Density of States in Low Voltage Operating Range, High Mobility, Hf-In-ZnO/HfO2 TFTs Fabricated at Temperatures below 200 oC

    (2021)
    2 Citations

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Best Scientists Contributing to This Journal