| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Electronics and Electrical Engineering | 113 | 195 | 380 | 28 |
| Computer Science | 214 | 111 | 209 | 25 |
| Engineering and Technology | 840 | 15 | 32 | 10 |
The scientific interests tackled in the journal are Electronic engineering, CMOS, Very-large-scale integration, Embedded system and Electrical engineering. Issues in Electronic engineering were discussed, taking into consideration concepts from other disciplines like Voltage, Electronic circuit, Low-power electronics and Integrated circuit. The Integrated circuit works featured in the journal incorporate elements from Integrated circuit design and Circuit design.
The research on CMOS discussed in IEEE Transactions on Very Large Scale Integration Systems draws on the closely related field of Transistor. The journal addresses concerns in Very-large-scale integration which are intertwined with other disciplines, such as Algorithm and Parallel computing. In it, Energy consumption, Computer hardware and Cache are investigated in conjunction with one another to address concerns in Embedded system research.
Gate array is a major topic of Field-programmable gate array research. Topics like Logic synthesis and Logic family are tackled as part of the discussions on Logic gate.
The journal papers investigate areas of study like Electronic engineering, CMOS, Embedded system, Very-large-scale integration and Integrated circuit. The journal papers explore topics in Electronic engineering which can be helpful for research in disciplines like Electronic circuit, Electrical engineering and Low-power electronics. While Very-large-scale integration is the focus of the published articles, it also provides insights into the studies of Clock rate, Algorithm and Parallel computing.
IEEE Transactions on Very Large Scale Integration Systems is organized to address concerns in the fields of Electronic engineering, CMOS, Computer hardware, Logic gate and Very-large-scale integration. The journal facilitates discussions on Electronic engineering that incorporate concepts from other fields like Noise (electronics), Bandwidth (computing) and Successive approximation ADC, Capacitor. Topics in CMOS were tackled in line with various other fields like Low voltage and Transistor.
The featured Computer hardware research zeroes in on concepts in Field-programmable gate array and Gate array but also tackles themes under Throughput (business). Some problems in Logic gate that were presented in IEEE Transactions on Very Large Scale Integration Systems overlapped with concepts under Electronic circuit and Integrated circuit. The study of Algorithm and how it intertwines with concepts under Benchmark (computing) were explored in the presented Very-large-scale integration research.
A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing in IEEE Transactions on Very Large Scale Integration Systems (based on the number of publications) are:
The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing in IEEE Transactions on Very Large Scale Integration Systems (based on the number of publications) are:
The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 11.52% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 15.98% were posted by at least one author from the top 10 institutions publishing in the journal. Another 7.10% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 19.53% of all publications and 57.40% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
Adarsha Balaji;Francky Catthoor;Anup Das;Yuefeng Wu
(2020)Yunxuan Yu;Chen Wu;Tiandong Zhao;Kun Wang
(2020)Mohammad Saeed Ansari;Vojtech Mrazek;Bruce F. Cockburn;Lukas Sekanina
(2020)Chaoyang Zhu;Kejie Huang;Shuyuan Yang;Ziqi Zhu
(2020)Ahmet Can Mert;Erdinc Ozturk;Erkay Savas
(2020)Tomasz Kulej;Fabian Khateb
(2020)Matheus Cavalcante;Fabian Schuiki;Florian Zaruba;Michael Schaffner
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