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CMD

9th International Conference on Condition Monitoring and Diagnosis 2022 (CMD)

Location: Kitakyushu , Japan

Submission deadline: 4/8/2022

Conference dates: 11/13/2022 - 11/18/2022

Research H-index
5

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 419 17 30 5

Call for Papers

Main topics:
Condition monitoring and diagnosis for power equipment and power systems
Condition monitoring and diagnosis for industry, innovation and infrastructure
Condition monitoring and diagnosis in renewable energy plants and affordable and clean energy
Failure phenomena for power equipment based on electrical, mechanical, chemical and thermal causes
Dielectric materials and their aging mechanisms
Degradation assessment for power equipment
State-of-the-art methodologies and strategies for effective replacement
Advanced sensing techniques and IoT technologies for condition monitoring and diagnosis
Applications of AI technologies for data mining and condition assessment
Responsible consumption and production issues including reduce, reuse and recycle

Overview

This ranking presents a comprehensive list of scientific conferences in the field of Electronics and Electrical Engineering, meticulously curated to reflect the highest standards of academic excellence and impact. Developed by Research.com, a premier resource for science research across all major disciplines, this ranking leverages trusted data and expertise accumulated since 2014. Research.com has established a reputation for delivering reliable information on scientific contributions, with a particular focus on areas such as Electronics and Electrical Engineering.

The position of each conference in this ranking is determined by a unique bibliometric score, an innovative metric designed by Research.com experts. This score is calculated by utilizing the estimated h-index and the number of distinguished scientists who have presented at each conference over the past three years. The ranking incorporates Impact Score values collected as of 2024-11-27, providing a timely and accurate reflection of conference influence within the academic community.

The underlying process involved a rigorous evaluation of more than 2,204 conferences, each selected after an exhaustive review and assessment of over 95,378 scientific documents published in the last three years by 6,160 leading and highly respected researchers in the Electronics and Electrical Engineering domain. This systematic and thorough approach ensures that only conferences demonstrating exceptional scientific contribution and engagement by prominent experts are included in the final ranking.

For detailed information on the methodology used to compute the ranking scores, please visit our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Conference on Condition Monitoring and Diagnosis (based on the number of publications) are:

  • Norasage Pattanadech (23 papers) published 18 papers at the last edition,
  • Masayuki Hikita (14 papers) published 2 papers at the last edition,
  • Guan-Jun Zhang (13 papers) absent at the last edition,
  • Johan J. Smit (13 papers) absent at the last edition,
  • Hans Michael Muhr (11 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Conference on Condition Monitoring and Diagnosis (based on the number of publications) are:

  • Xi'an Jiaotong University (115 papers) published 8 papers at the last edition,
  • Electric Power Research Institute (80 papers) published 8 papers at the last edition,
  • Shanghai Jiao Tong University (29 papers) published 9 papers at the last edition,
  • King Mongkut's Institute of Technology Ladkrabang (25 papers) published 21 papers at the last edition,
  • North China Electric Power University (17 papers) published 5 papers at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2020 edition, 19.19% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 70.00% were posted by at least one author from the top 10 institutions publishing at the conference. Another 8.75% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 8.75% of all publications and 12.50% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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