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IEEE

28th International Semiconductor Laser Conference (ISLC)

Location: Matsue , Japan

Submission deadline: 5/9/2022

Conference dates: 10/16/2022 - 10/19/2022

Research H-index
4

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 106 38 59 2
Electronics and Electrical Engineering 571 69 135 3

Call for Papers

Semiconductor lasers
Semiconductor optical amplifiers
Silicon compatible lasers
Surface emitting lasers
(VCSELs, VECSELs, and PCSELs) and related devices
Photonic band-gap and microcavity lasers
Grating controlled lasers
Multi-segment and ring lasers
Quantum cascade and interband cascade lasers
Sub-wavelength scale nanolasers
MWIR, LWIR, and THz sources
InP, GaAs and Sb materials
Quantum dot lasers
High power and high-brightness lasers
GaN and ZnSe based UV to visible LDs and LEDs
Lasers for communications,
LIDAR, and atomic applications
Semiconductor photonic integrated circuits

Overview

This ranking presents a comprehensive list of scientific conferences within the field of Engineering and Technology, meticulously curated by Research.com—one of the leading platforms for science research spanning all major disciplines. Since 2014, Research.com has been recognized for delivering trusted, data-driven insights into scientific contributions across various domains, including Engineering and Technology.

The position of each conference in this ranking is determined by a unique bibliometric score developed by Research.com. This score integrates the estimated h-index with the number of leading scientists who have participated in each conference during the preceding three years, providing a robust measure of both the influence of the event and the caliber of contributors involved. The Impact Score values presented in this ranking were compiled as of 2024-11-27.

The evaluation process underlying the ranking involved an exhaustive assessment of more than 2,262 conferences. This selection followed a rigorous and detailed inspection of over 26,934 scientific documents published within the last three years, authored by 9,385 prominent and respected experts in Engineering and Technology. Such an extensive, expert-led process ensures that the rankings reflect both the depth and the dynamic nature of scientific discourse in the field.

For a detailed overview of the criteria and methodology utilized in computing these ranking scores, please consult our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Semiconductor Laser Conference (based on the number of publications) are:

  • Larry A. Coldren (35 papers) published 3 papers at the last edition, 2 more than at the previous edition,
  • Fumio Koyama (34 papers) published 3 papers at the last edition the same number as at the previous edition,
  • Stephen J. Sweeney (32 papers) published 3 papers at the last edition, 1 more than at the previous edition,
  • Peter Michael Smowton (32 papers) published 1 paper at the last edition, 2 less than at the previous edition,
  • John E. Bowers (31 papers) published 6 papers at the last edition the same number as at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Semiconductor Laser Conference (based on the number of publications) are:

  • University of California, Santa Barbara (66 papers) published 10 papers at the last edition, 1 more than at the previous edition,
  • Tokyo Institute of Technology (56 papers) published 7 papers at the last edition, 2 less than at the previous edition,
  • Nippon Telegraph and Telephone (42 papers) published 6 papers at the last edition, 1 more than at the previous edition,
  • University of Surrey (40 papers) published 3 papers at the last edition, 1 more than at the previous edition,
  • Alcatel-Lucent (40 papers) absent at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2018 edition, 10.74% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 27.78% were posted by at least one author from the top 10 institutions publishing at the conference. Another 19.44% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 32.41% of all publications and 20.37% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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