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2025 Asia-Pacific International Symposium and Exhibition on Electromagnetic Compatibility (APEMC) (APSEC)

Location: Taipai , Taiwan

Conference dates: 5/19/2025 - 5/23/2025

Research H-index
4

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 508 20 44 4

Call for Papers

The 2025 Asia-Pacific International Symposium and Exhibition on Electromagnetic Compatibility (APEMC) will be held in Taipei, Taiwan, from May 19 to 23, 2025. The symposium aims to share recent advances in all aspects of EMC in the Asia-Pacific region, to respond to the EMC requirements for all rising technologies, and to link up the international EMC community closely. The symposium will cover the entire scope of EMC; especially, it will offer a rich technical program of the highest quality, lectures presented by distinguished speakers from all over the world, and a broad forum for interacting between academia and industry. We wish to invite all prospective authors and experts to submit original papers on their latest research. We also encourage proposals for special sessions, workshops, tutorials, and exhibitions.

Overview

The scientific conference ranking presented on this page offers a comprehensive overview of top conferences in the field of Electronics and Electrical Engineering. This ranking has been meticulously prepared by Research.com, a premier resource for reliable data and analytics in science research since 2014, providing trusted insights across all significant fields, including Electronics and Electrical Engineering.

Each conference’s position in the ranking is determined by a unique bibliometric score developed by Research.com. This score is calculated based on two primary factors: the estimated h-index of the conference and the number of leading scientists who have participated in the conference over the previous three years. The rigorous methodology ensures a balanced evaluation reflecting both the quality and influence of the conferences and the caliber of contributors they attract.

The Impact Score values shown in this ranking were gathered on 2024-11-27, ensuring the data is current and relevant. The ranking process entailed the thorough examination of more than 2,204 conferences, which were shortlisted following an intensive review of over 95,378 scientific documents published during the past three years. This analysis was conducted by 6,160 respected and distinguished scientists specializing in Electronics and Electrical Engineering, ensuring a comprehensive and accurate representation of the field’s academic landscape.

The complex and in-depth analysis underpinning this ranking highlights the commitment of Research.com experts to delivering transparent, reliable, and up-to-date information for the academic community. For a detailed explanation of the methods and data sources used to compute the ranking scores, please refer to our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at Asia-Pacific Symposium on Electromagnetic Compatibility (based on the number of publications) are:

  • Frank Leferink (16 papers) published 6 papers at the last edition, 2 more than at the previous edition,
  • Er-Ping Li (16 papers) published 7 papers at the last edition, 4 more than at the previous edition,
  • Kye Yak See (14 papers) published 4 papers at the last edition the same number as at the previous edition,
  • Joungho Kim (13 papers) published 4 papers at the last edition the same number as at the previous edition,
  • Yu-ichi Hayashi (13 papers) published 10 papers at the last edition, 9 more than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at Asia-Pacific Symposium on Electromagnetic Compatibility (based on the number of publications) are:

  • Nanyang Technological University (28 papers) published 9 papers at the last edition, 4 more than at the previous edition,
  • Zhejiang University (26 papers) published 15 papers at the last edition, 12 more than at the previous edition,
  • Feng Chia University (20 papers) published 7 papers at the last edition, 2 more than at the previous edition,
  • KAIST (17 papers) published 6 papers at the last edition, 2 more than at the previous edition,
  • Yuan Ze University (17 papers) published 4 papers at the last edition, 6 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2018 edition, 12.40% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 19.18% were posted by at least one author from the top 10 institutions publishing at the conference. Another 14.47% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 22.01% of all publications and 44.34% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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