World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
33
Citations
4047
World Ranking
6127
National Ranking
2031

Best Publications

  • Transient conduction in multidielectric silicon–oxide–nitride–oxide semiconductor structures

    H. Bachhofer;H. Reisinger;E. Bertagnolli;H. von Philipsborn

  • Tuning the Electro-optical Properties of Germanium Nanowires by Tensile Strain

    J. Greil;A. Lugstein;C. Zeiner;G. Strasser

  • Technology and Performance of InAlN/AlN/GaN HEMTs With Gate Insulation and Current Collapse Suppression Using Zr $\hbox{O}_{m 2}$ or Hf $\hbox{O}_{m 2}$

    J. Kuzmik;G. Pozzovivo;S. Abermann;J.-F. Carlin

  • Anomalous Piezoresistance Effect in Ultrastrained Silicon Nanowires

    Unknown

  • Pressure-Induced Orientation Control of the Growth of Epitaxial Silicon Nanowires

    Unknown

  • MOCVD of HfO2 and ZrO2 high-k gate dielectrics for InAlN/AlN/GaN MOS-HEMTs

    S. Abermann;G. Pozzovivo;J. Kuzmik;G. Strasser

  • Full three-dimensional simulation of focused ion beam micro/nanofabrication

    Unknown

  • FIB processing of silicon in the nanoscale regime

    Unknown

  • Atomic Scale Alignment of Copper-Germanide Contacts for Ge Nanowire Metal Oxide Field Effect Transistors

    Unknown

  • Fabrication of a ring nanoelectrode in an AFM tip: novel approach towards simultaneous electrochemical and topographical imaging

    Alois Lugstein;Emmerich Bertagnolli;Christine Kranz;Boris Mizaikoff

  • Simulation of ion beam induced micro/nano fabrication

    Unknown

  • Current density profile extraction of focused ion beams based on atomic force microscopy contour profiling of nanodots

    Unknown

  • Abrupt Schottky Junctions in Al/Ge Nanowire Heterostructures.

    S. Kral;C. Zeiner;M. Stöger-Pollach;E. Bertagnolli

  • Simulation of ion beam direct structuring for 3D nanoimprint template fabrication

    Unknown

  • Origin of Anomalous Piezoresistive Effects in VLS Grown Si Nanowires

    Unknown

  • Orientation specific synthesis of kinked silicon nanowires grown by the vapour–liquid–solid mechanism

    Unknown

  • Vertical N-channel MOSFETs for extremely high density memories: the impact of interface orientation on device performance

    Unknown

  • Evolution of tungsten film deposition induced by focused ion beam

    Unknown

  • Focused ion beam induced surface amorphization and sputter processes

    Unknown

  • Example of a Negative Effective Poisson's Ratio

    E. Kittinger;J. Tichý;E. Bertagnolli

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