| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Materials Science | 353 | 90 | 160 | 20 |
Silicon facilitates discussions on Composite material, Optoelectronics, Silicon, Analytical chemistry and Scanning electron microscope. Composite number, Ultimate tensile strength, Microstructure, Flexural strength and Alloy are among the areas of Composite material tackled. Tribology and Silicon carbide are some topics wherein Composite number research discussed in Silicon have an impact.
Issues in Optoelectronics were discussed, taking into consideration concepts from other disciplines like Threshold voltage, Transistor and Transconductance. The study of Metallurgy serves as the foundation of the Silicon research discussed in Silicon. While work presented in it provided substantial information on Analytical chemistry, it also covered topics in Thin film and Band gap.
Scanning electron microscope and Fourier transform infrared spectroscopy are closely related fields of research discussed in the journal. Many of the studies tackled connect Fourier transform infrared spectroscopy with a similar field of study like Nuclear chemistry.
The journal publications are mainly concerned with subjects like Composite material, Silicon, Composite number, Analytical chemistry and Metallurgy. The journal articles focus on Composite material research which is adjacent to topics in Machining. The published papers focus on Silicon but sometimes tackle the closely related topic of Inorganic chemistry which is concerned with Aqueous solution.
A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing in Silicon (based on the number of publications) are:
The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing in Silicon (based on the number of publications) are:
The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 10.29% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 16.21% were posted by at least one author from the top 10 institutions publishing in the journal. Another 9.60% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 19.83% of all publications and 54.36% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
A. A. Menazea;A. M. Abdelghany;N. A. Hakeem;W. H. Osman
(2020)A. F. Abd El-Rehim;A. F. Abd El-Rehim;H. Y. Zahran;H. Y. Zahran;I. S. Yahia;I. S. Yahia;Atif Mossad Ali;Atif Mossad Ali
(2020)A.F. Abd El-Rehim;A.F. Abd El-Rehim;H.Y. Zahran;H.Y. Zahran;I.S. Yahia;I.S. Yahia;Sayed A. Makhlouf
(2021)Paul Venyite;Eugene Charles Makone;Rodrigue Cyriaque Kaze;Achile Nana
(2021)Fehmi Aslan;Hikmet Esen;Fahrettin Yakuphanoglu
(2020)Sylvain Tome;Sylvain Tome;Achile Nana;Cyriaque Rodrigue Kaze;Jean Noel Yankwa Djobo
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