IEEE Journal on Exploratory Solid-State Computational Devices and Circuits

Top Research Topics at IEEE Journal on Exploratory Solid-State Computational Devices and Circuits?

The journal is organized to address concerns in the fields of Logic gate, Transistor, Electronic engineering, CMOS and Electronic circuit. It tackles studies in Topology and the interrelated subject of Magnetic domain to gain insights into Logic gate. The journal addresses concerns in Transistor which are intertwined with other disciplines, such as Optoelectronics and Static random-access memory.

The journal explores issues in Optoelectronics which can be linked to other research areas like Spintronics, Magnetic field and Capacitor. Issues in Electronic engineering were discussed, taking into consideration concepts from other disciplines like Power (physics), Artificial neural network, Energy (signal processing), Node (circuits) and Benchmark (computing). It explores topics in CMOS which can be helpful for research in disciplines like Neuromorphic engineering, Circuit design, Cellular neural network, Beyond CMOS and Efficient energy use.

The journal is concerned with the study of Electronic circuit and Electrical engineering in general. Research on Electrical engineering presented in IEEE Journal on Exploratory Solid-State Computational Devices and Circuits focuses, in particular, on Digital electronics and Logic family. While Field-effect transistor is the focus of it, it also provided insights into the studies of Arithmetic logic unit, Heterojunction and Quantum tunnelling.

• Logic gate (29.31%)
• Transistor (27.59%)
• Electronic engineering (27.59%)

What are the most cited papers published in the journal?

• Benchmarking of Beyond-CMOS Exploratory Devices for Logic Integrated Circuits (230 citations)
• Tunnel Field-Effect Transistors in 2-D Transition Metal Dichalcogenide Materials (144 citations)
• Coupled-Oscillator Associative Memory Array Operation for Pattern Recognition (112 citations)

Research areas of the most cited articles at IEEE Journal on Exploratory Solid-State Computational Devices and Circuits:

The most cited publications mainly tackle studies in Electronic engineering, Field-effect transistor, Electrical engineering, Content-addressable memory and Synchronization networks. The study of Field-effect transistor in the most cited publications encompasses disciplines such as Optoelectronics, as well as fields such as Energy (signal processing) and Acceptor, all of which overlap with one another. While Transistor is the key highlight in the published articles, thet also covered some subjects on Poisson's equation and CMOS and Logic gate.

What topics the last edition of the journal is best known for?

• Quantum mechanics
• Electrical engineering
• Algorithm

The previous edition focused in particular on these issues:

Artificial intelligence, Static random-access memory, Resistive random-access memory, Transistor and Reduction (complexity) are the subjects of interest in IEEE Journal on Exploratory Solid-State Computational Devices and Circuits. Aside from investigating topics in Deep belief network, Neuromorphic engineering and Feature (computer vision) under Artificial intelligence, the journal also explores concepts in Fuzzy neural. NAND gate, Energy (signal processing) and Chip are some topics wherein Static random-access memory research discussed in it have an impact.

The research on Resistive random-access memory featured in the journal combines topics in other fields like PMOS logic, NMOS logic and Convolutional neural network. Topics in Transistor were tackled in line with various other fields like Electronic circuit, Logic gate, Nanowire and Topology. While IEEE Journal on Exploratory Solid-State Computational Devices and Circuits focused on Logic gate, it was also able to explore topics like Threshold voltage, CMOS, Arithmetic and Reliability (semiconductor).

The most cited articles from the last journal are:

• Differential Electrically Insulated Magnetoelectric Spin-Orbit Logic Circuits (1 citations)
• Ferroelectric Field-Effect Transistor-Based 3-D NAND Architecture for Energy-Efficient on-Chip Training Accelerator (1 citations)
• Combining accuracy and plasticity in convolutional neural networks based on resistive memory arrays for autonomous learning (0 citations)

Papers citation over time

A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing in IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (based on the number of publications) are:

• Dmitri E. Nikonov (19 papers) published 1 paper at the last edition the same number as at the previous edition,
• Ian A. Young (17 papers) published 1 paper at the last edition,
• Azad Naeemi (11 papers) absent at the last edition,
• Sachin S. Sapatnekar (9 papers) published 1 paper at the last edition, 1 less than at the previous edition,
• Chenyun Pan (9 papers) absent at the last edition.

The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing in IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (based on the number of publications) are:

• Intel (25 papers) published 2 papers at the last edition, 1 less than at the previous edition,
• Georgia Institute of Technology (23 papers) published 5 papers at the last edition, 3 more than at the previous edition,
• University of Notre Dame (14 papers) absent at the last edition,
• University of Minnesota (13 papers) published 1 paper at the last edition, 2 less than at the previous edition,
• Synopsys (4 papers) published 2 papers at the last edition.

The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 33.33% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 66.67% were posted by at least one author from the top 10 institutions publishing in the journal. Another 25.00% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 8.33% of all publications and 0.00% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.