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IEEE

RFIC 2022: IEEE Radio Frequency Integrated Circuits Symposium (RFIC)

Location: denver, Colorado , United States

Submission deadline: 1/16/2022

Conference dates: 6/19/2022 - 6/21/2022

Research H-index
15

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 55 92 171 15

Call for Papers

Wireless Radios and Systems-on-Chip: innovative circuit and system-on-chip concepts related to softwaredefined radio, cognitive radio, interference cancellation, full-duplex, advanced SOCs for cellular/WiFi, GPS, lowpower radio circuits for sensors, IoT, Zigbee, biomedical applications, radio architectures suitable for energy
harvesting, wake-up receivers, etc.
• mmWave Communication Circuits and Systems-on-Chip: >20GHz (i.e., mmWave through THz) circuits and
SOCs for wireless communication, including 5G, phase shifters, phased arrays, beamformers, and MIMO
transceivers.
• Radar, Imager, and Sensor Systems-on-Chip: integrated radar, imaging, spectroscopy, and sensing circuits at
microwave through THz frequencies, including vehicular radar SOCs.
• Transmitters and Power Amplifiers: for RF through mmWave frequencies and higher, power amplifiers, drivers,
modulators, digital transmitters, advanced TX circuits, linearization and efficiency enhancement techniques, etc.
• Front-End Circuits: LNAs, mixers, VGAs, T/R switches, integrated FEM, amplifiers, filters, demodulators.
• Analog and Mixed-Signal Circuits: RF and baseband converters (ADC/DAC), sub-sampling/over-sampling
circuits, converters for digital beamforming, converters for emerging TX and RX architectures, power (DC-DC)
converters for RF applications, I/O transceivers and CDRs for wireline and optical connectivity.
• Oscillators and Frequency Synthesizers: VCOs, injection-locking frequency dividers/multipliers, PLLs, DLLs,
MDLLS, DDS, LO drivers, frequency dividers.
• Device/Packaging/Modeling and Testing Technologies: RF device technology (both silicon and compound
semiconductors), MEMs, integrated passives, photonic, reliability, packaging, modeling and testing, EM
modeling/co-simulation, built-in-self-test (BIST).
• Emerging Circuit Technologies: MEMs-based sensors and actuators, 3D ICs, silicon photonics, quantum
computing ICs, hardware security, novel terahertz solutions, and AI/machine learning applied to RF circuits.

Overview

This ranking presents a comprehensive evaluation of scientific conferences in the field of Electronics and Electrical Engineering. The list has been meticulously compiled by Research.com, widely recognized as one of the leading platforms for science research across major academic disciplines, including Electronics and Electrical Engineering. Since 2014, Research.com has provided trusted and authoritative data regarding scientific output and contributions.

The conference positions in this ranking are determined based on a unique bibliometric score developed by Research.com. This score is calculated using a carefully weighted combination of the estimated h-index, together with the number of leading scientists who have participated in the conference over the preceding three years. The inclusion of these criteria ensures a robust reflection of each conference’s impact and prestige within the research community.

The ranking encompasses Impact Score values collected as of 2024-11-27, reflecting the most up-to-date and relevant data available. The ranking process involved the thorough examination of more than 2,204 conferences, all of which were selected following an exhaustive review and rigorous analysis. This process included the evaluation of over 95,378 scientific documents published within the last three years by 6,160 highly respected and influential scientists in the field of Electronics and Electrical Engineering.

For those interested in a deeper understanding of the methodology behind the calculation of ranking scores, comprehensive details are available on our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at Radio Frequency Integrated Circuits Symposium (based on the number of publications) are:

  • Lawrence E. Larson (35 papers) absent at the last edition,
  • Gabriel M. Rebeiz (31 papers) published 5 papers at the last edition, 4 more than at the previous edition,
  • Ali M. Niknejad (30 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • Robert Bogdan Staszewski (22 papers) absent at the last edition,
  • J. Laskar (20 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at Radio Frequency Integrated Circuits Symposium (based on the number of publications) are:

  • University of California, San Diego (77 papers) published 6 papers at the last edition the same number as at the previous edition,
  • STMicroelectronics (68 papers) published 3 papers at the last edition, 1 less than at the previous edition,
  • IBM (58 papers) published 1 paper at the last edition, 4 less than at the previous edition,
  • Texas Instruments (51 papers) published 2 papers at the last edition the same number as at the previous edition,
  • Samsung (51 papers) published 3 papers at the last edition, 1 more than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 2.86% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 23.53% were posted by at least one author from the top 10 institutions publishing at the conference. Another 16.67% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 25.49% of all publications and 34.31% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Related Online Degrees & Career Pathways

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To find the right fit, review rankings like the best online electrical engineering programs USA. These help identify top-quality options that align with your career goals and offer the flexibility needed in today’s fast-paced environment.

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