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IEEE

MAPE 2026 — IEEE 11th International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications (MAPE)

Location: Nanjing , China

Submission deadline: 6/15/2026

Conference dates: 11/21/2026 - 11/22/2026

Research H-index
4

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 484 50 82 4

Call for Papers

MAPE is a biennial IEEE-sponsored Chinese symposium on microwave, antenna, propagation and EMC technologies for wireless communications. It invites original contributions on microwave and millimeter-wave circuits, antennas and arrays, propagation modeling, EMC for wireless, RF front-ends, metamaterials, wireless systems. Submissions may take the form of full research papers, extended abstracts and poster presentations reporting theoretical, computational and experimental work, as well as industrial case studies and applications. The meeting brings together researchers, engineers, industry practitioners and students to exchange recent results and discuss emerging directions in the field. Accepted papers are published in the conference proceedings and submitted to IEEE Xplore.

Overview

This ranking presents a comprehensive evaluation of scientific conferences in the field of Electronics and Electrical Engineering. Prepared by Research.com, a respected authority on science research since 2014, the ranking is based on a rigorous and multifactorial assessment of conference impact and influence. Research.com is widely recognized for delivering reliable data on scientific contributions across all major fields, with a particular emphasis on areas such as Electronics and Electrical Engineering.

The ranking positions conferences according to a proprietary bibliometric score uniquely developed by Research.com. This score integrates the estimated h-index of contributing authors and the number of leading scientists who have participated in each conference over the preceding three years, ensuring an insightful and multidimensional assessment of scientific significance. The Impact Score values in this ranking are based on data gathered as of 2024-11-27.

The conference selection process was exceptionally thorough, involving the initial consideration of over 2204 events. Each conference was evaluated through detailed inspection and rigorous examination of more than 95,378 scientific documents published within the past three years by a cohort of 6,160 leading and respected scientists in Electronics and Electrical Engineering. This in-depth analysis highlights the credibility and complexity of the methodology applied, representing months of expert-driven research and data validation.

For a comprehensive explanation of the methodology used in computing the ranking scores, please visit our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications (based on the number of publications) are:

  • Yinghong Wen (21 papers) published 3 papers at the last edition, 4 less than at the previous edition,
  • Wenbo Wang (19 papers) absent at the last edition,
  • Junhong Wang (17 papers) published 8 papers at the last edition, 6 more than at the previous edition,
  • Donglin Su (16 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Zhaowen Yan (14 papers) published 3 papers at the last edition, 1 more than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications (based on the number of publications) are:

  • Beijing Jiaotong University (165 papers) published 27 papers at the last edition, 7 more than at the previous edition,
  • Beihang University (102 papers) published 7 papers at the last edition, 1 less than at the previous edition,
  • Beijing University of Posts and Telecommunications (92 papers) published 1 paper at the last edition, 7 less than at the previous edition,
  • Xidian University (87 papers) published 1 paper at the last edition, 4 less than at the previous edition,
  • Beijing Institute of Technology (54 papers) absent at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 21.21% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 37.50% were posted by at least one author from the top 10 institutions publishing at the conference. Another 21.15% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 21.15% of all publications and 20.19% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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