World's Best Scientists 2026 revealed!

D-Index & Metrics

Mathematics

D-Index
43
Citations
9112
World Ranking
1680
National Ranking
726

Research.com Recognitions

  • 2014 - SIAM Fellow For contributions to the mathematical and numerical analysis of nonlinear problems of PDEs and applications in inverse problems, homogenization, and material science.
  • 2013 - Fellow of the American Mathematical Society
  • 1985 - Fellow of Alfred P. Sloan Foundation

Overview

Michael Vogelius is affiliated with Rutgers, The State University of New Jersey in the United States. The scientist's research spans significant contributions in the areas of Mathematics and Engineering, with a specific focus on subfields such as Mathematical Physics, Computational Theory and Mathematics, Biomedical Engineering, Mechanics of Materials, and Electronic, Optical and Magnetic Materials.

The research primarily addresses topics including Numerical methods in inverse problems, Advanced Mathematical Modeling in Engineering, Microwave Imaging and Scattering Analysis, Advanced Mathematical Physics Problems, Metamaterials and Metasurfaces Applications, Numerical methods in engineering, and Electromagnetic Scattering and Analysis.

Recent papers authored by Michael Vogelius include:

  • Singularities almost always scatter: Regularity results for non-scattering inhomogeneities (2023), Communications on Pure and Applied Mathematics
  • On the Regularity of Non-scattering Anisotropic Inhomogeneities (2023), Archive for Rational Mechanics and Analysis
  • Finiteness Results Concerning Nonscattering Wave Numbers for Incident Plane and Herglotz Waves (2021), SIAM Journal on Mathematical Analysis
  • Small perturbations in the type of boundary conditions for an elliptic operator (2022), Journal de Mathématiques Pures et Appliquées
  • Singularities Almost Always Scatter: Regularity Results for Non-scattering Inhomogeneities (2021), arXiv (Cornell University)

Frequent coauthors in Vogelius's collaborations include Fioralba Cakoni, Jingni Xiao, Narek Hovsepyan, Éric Bonnetier, and Charles Dapogny.

Publications appear mainly in venues such as arXiv (Cornell University), SIAM Journal on Mathematical Analysis, Journal de Mathématiques Pures et Appliquées, Communications on Pure and Applied Mathematics, and Archive for Rational Mechanics and Analysis.

Michael Vogelius has received several fellowships and awards including:

  • SIAM Fellow (2014) for contributions to the mathematical and numerical analysis of nonlinear problems of PDEs and applications in inverse problems, homogenization, and material science
  • Fellow of the American Mathematical Society (2013)
  • Fellow of Alfred P. Sloan Foundation (1985)

Best Publications

  • Determining conductivity by boundary measurements

    Robert Kohn;Michael Vogelius

  • Determining conductivity by boundary measurements II. Interior results

    R. V. Kohn;M. Vogelius

  • Norm estimates for a maximal right inverse of the divergence operator in spaces of piecewise polynomials

    L. R. Scott;M. Vogelius

  • A new model for thin plates with rapidly varying thickness

    Robert V. Kohn;Michael Vogelius

  • Gradient estimates for solutions to divergence form elliptic equations with discontinuous coefficients

    Yan Yan Li;Michael Vogelius

  • Identification of conductivity imperfections of small diameter by boundary measurements. Continuous dependence and computational reconstruction

    D J Cedio-Fengya;S Moskow;M S Vogelius

  • A backprojection algorithm for electrical impedance imaging

    Fadil Santos;Michael Vogelius

  • Relaxation of a variational method for impedance computed tomography

    Robert V. Kohn;Michael Vogelius

  • Determining Cracks by Boundary Measurements

    Avner Friedman;Michael Vogelius

  • Cloaking via change of variables in electric impedance tomography

    R. V. Kohn;H. Shen;Michael Vogelius;M. I. Weinstein

  • Identification of small inhomogeneities of extreme conductivity by boundary measurements: a theorem on continuous dependence

    Avner Friedman;Michael Vogelius

  • Feedback and adaptive finite element solution of one-dimensional boundary value problems

    I. Bubuška;M. Vogelius

  • Asymptotic formulas for perturbations in the electromagnetic fields due to the presence of inhomogeneities of small diameter II. The full Maxwell equations

    Habib Ammari;Michael S Vogelius;Darko Volkov

  • An analysis of thep-version of the finite element method for nearly incompressible materials

    Michael Vogelius

  • A direct impedance tomography algorithm for locating small inhomogeneities

    Martin Brühl;Martin Hanke;Michael S. Vogelius

  • Asymptotic formulas for perturbations in the electromagnetic fields due to the presence of inhomogeneities of small diameter

    Michael S. Vogelius;Darko Volkov

  • First-order corrections to the homogenised eigenvalues of a periodic composite medium. A convergence proof

    Shari Moskow;Michael Vogelius

  • Cloaking via change of variables for the Helmholtz equation

    Robert V. Kohn;Daniel Onofrei;Michael S. Vogelius;Michael I. Weinstein

  • On a dimensional reduction method. I. The optimal selection of basis functions

    M. Vogelius;I. Babuška

  • A new model for thin plates with rapidly varying thickness. II. A convergence proof

    Robert V. Kohn;Michael Vogelius

Frequent Co-Authors

Robert V. Kohn
Robert V. Kohn Courant Institute of Mathematical Sciences
Habib Ammari
Habib Ammari ETH Zurich
Avner Friedman
Avner Friedman The Ohio State University
Ivo Babuška
Ivo Babuška The University of Texas at Austin
Michael I. Weinstein
Michael I. Weinstein Columbia University
Martin Hanke
Martin Hanke Johannes Gutenberg University of Mainz
Hyeonbae Kang
Hyeonbae Kang Inha University
Douglas N. Arnold
Douglas N. Arnold University of Minnesota
George Papanicolaou
George Papanicolaou Stanford University
YanYan Li
YanYan Li Rutgers, The State University of New Jersey

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