Location: Changbai Mountain , China
Submission deadline: 4/10/2022
Conference dates: 7/27/2022 - 7/31/2022
| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Electronics and Electrical Engineering | 706 | 29 | 45 | 2 |
| Engineering and Technology | 357 | 17 | 33 | 2 |
This comprehensive ranking presents a meticulously curated list of scientific conferences in the field of Engineering and Technology. Developed by Research.com, a prominent authority in science research with a proven track record of providing trusted data on scientific contributions since 2014, the ranking reflects the depth and diversity of academic endeavors in Engineering and Technology.
Conference positions in this ranking are determined through a proprietary bibliometric score designed by Research.com. This score is calculated using a combination of factors, including the estimated h-index and the number of leading scientists—those with established reputations—who have contributed to the conferences over the last three years. The Impact Score values featured in this ranking were collected on 2024-11-27.
The ranking process entailed the examination of more than 2,262 conferences in Engineering and Technology. Selection was based on a rigorous and detailed inspection of over 26,934 scientific documents published during the previous three years by a cohort of 9,385 leading and well-respected scientists in the discipline. This methodology ensures that the ranked conferences represent the highest standards of scientific impact and influence within the international research community.
For a comprehensive explanation of the methodology and the weighting of various metrics incorporated into the bibliometric score, please refer to our Methodology Page.
A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing at IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (based on the number of publications) are:
The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing at IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (based on the number of publications) are:
The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2020 edition, 0.00% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 0.00% were posted by at least one author from the top 10 institutions publishing at the conference. Another 0.00% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 0.00% of all publications and 100.00% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
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