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IEEE

INTERNATIONAL CONFERENCE ON OPTICAL MEMS AND NANOPHOTONICS - OMN 2024 (OMN)

Location: San Sebastian , Spain

Conference dates: 8/28/2024 - 9/1/2024

Research H-index
8

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 41 17 25 5
Electronics and Electrical Engineering 208 32 60 8
Engineering and Technology 122 18 22 5

Call for Papers

The International Conference on Optical MEMS and Nanophotonics is an annual conference that addresses research topics related to optics and photonics at the micro- and nanoscale. Related applications comprise technology areas such as imaging, communication, sensing, and instrumentation, and encompasses sciences such as biology and medicine, chemistry, and fundamental physics. The conference offers researchers the opportunity to report on their latest findings in the field of Optical MEMS and Nanophotonics and to promote scientific exchange between researchers and engineers from industry and academia.

Optical MEMS and Nanophotonics technologies are enabling the miniaturization of photonic devices and systems that will provide new and enhanced capabilities for the Internet of Things (IoT); physical, chemical and bio-sensing; optical computing, storage and communication; medical instrumentation and healthcare; optical imaging and displays, among others.

Overview

The scientific conference ranking presented on this page offers a comprehensive evaluation of conferences in the field of Engineering and Technology. This ranking has been meticulously developed by Research.com, a recognized authority in science research across all major disciplines, including Engineering and Technology, and a trusted provider of data on scientific contributions since 2014.

Conference positions are determined using a proprietary bibliometric score devised by Research.com. This unique metric is calculated based on the estimated h-index and the number of leading scientists who have participated in the conference during the preceding three years, ensuring an objective, data-driven approach to ranking.

The Impact Score values featured in this ranking were collected as of 2024-11-27, ensuring the results reflect the most recent trends and achievements. The ranking process entailed a thorough examination of more than 2,262 conferences, selected following an extensive review and rigorous analysis of over 26,934 scientific documents published in the last three years by 9,385 prominent and influential scientists specializing in Engineering and Technology.

This depth of research and the complexity of analysis underscore our commitment to providing a robust, credible, and reliable assessment of scientific conferences for the academic and professional community. For a detailed explanation of the statistical models, selection processes, and the computation of ranking scores, please visit our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at IEEE/LEOS International Conference on Optical MEMS (based on the number of publications) are:

  • Hans Peter Herzig (14 papers) published 1 paper at the last edition, 3 less than at the previous edition,
  • N. F. de Rooij (14 papers) absent at the last edition,
  • W. Noell (11 papers) absent at the last edition,
  • Minoru Sasaki (8 papers) absent at the last edition,
  • Ming C. Wu (7 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at IEEE/LEOS International Conference on Optical MEMS (based on the number of publications) are:

  • University of California, Berkeley (13 papers) absent at the last edition,
  • Stanford University (10 papers) absent at the last edition,
  • University of Tokyo (9 papers) absent at the last edition,
  • University of California, Los Angeles (8 papers) absent at the last edition,
  • Tohoku University (7 papers) absent at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2005 edition, 100.00% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, nan% were posted by at least one author from the top 10 institutions publishing at the conference. Another nan% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included nan% of all publications and nan% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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